Zobrazeno 1 - 10
of 89
pro vyhledávání: '"Sang-Joon Cho"'
Autor:
Jonathan J. Campbell, Neil Almond, Young-Kyong Bae, Ravneet Bhuller, Andrea Briones, Sang-Joon Cho, Megan H. Cleveland, Thomas E. Cleveland, Francis Galaway, Hua-Jun He, Ulrike Herbrand, Jim F. Huggett, Sarah Kempster, Ibolya E. Kepiro, Arifa S. Khan, Edward Kwee, Wilson Li, Sheng Lin-Gibson, Luise Luckau, Caterina Minelli, Maxim G. Ryadnov, Isobel Searing, Lili Wang, Alexandra S. Whale, Julian H. Braybrook
Publikováno v:
Biologics, Vol 4, Iss 2, Pp 187-201 (2024)
Viral vectors are agents enabling gene transfer and genome editing and have widespread utility across the healthcare and biotechnology sectors. In January 2023, the International Bureau for Weights and Measures’ Consultative Committee for Amount of
Externí odkaz:
https://doaj.org/article/74b849504e464deaa369ec4a4b340589
Autor:
Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, Sang-Joon Cho, Haneol Cho, Jun-Ho Lee, Byoung-Woon Ahn
Publikováno v:
Applied Microscopy, Vol 52, Iss 1, Pp 1-8 (2022)
Abstract As semiconductor device architecture develops, from planar field-effect transistors (FET) to FinFET and gate-all-around (GAA), there is an increased need to measure 3D structure sidewalls precisely. Here, we present a 3-Dimensional Atomic Fo
Externí odkaz:
https://doaj.org/article/9a783280446a421caff3782f32780d03
Publikováno v:
Nanomaterials, Vol 11, Iss 6, p 1593 (2021)
The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modu
Externí odkaz:
https://doaj.org/article/3b980d0fda2a46328e7fda3d7cc8fc61
Autor:
Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, Jun-Ho Lee, Sang-Joon Cho, Haneol Cho, Byoung-Woon Ahn
As the semiconductor device architecture develops, from planar field-effect transistor (FET) to FinFET and toward gate all around (GAA), it is more needed to measure 3D structure sidewall precisely. Here, we present a 3D-atomic force microscopy (3D-A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fab4f4334008871b5f3a1eb25b4310f0
https://doi.org/10.21203/rs.3.rs-1148018/v1
https://doi.org/10.21203/rs.3.rs-1148018/v1
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Autor:
Myung-Hoon Choi, Yi Wang, Sang-Joon Cho, Xingchen Ye, Lane A. Baker, Soojin Jeong, Sang-il Park
Publikováno v:
Langmuir : the ACS journal of surfaces and colloids. 37(25)
Cetyltrimethylammonium bromide (CTAB) is a widely used surfactant that aids the aqueous synthesis of colloidal nanoparticles. However, the presence of residual CTAB on nanoparticle surfaces can significantly impact nanoparticle applications, such as
Publikováno v:
Nanomaterials, Vol 11, Iss 1593, p 1593 (2021)
Nanomaterials
Volume 11
Issue 6
Nanomaterials
Volume 11
Issue 6
The accurate measurement of nanoscale mechanical characteristics is crucial in the emerging field of soft condensed matter for industrial applications. An atomic force microscope (AFM) can be used to conduct nanoscale evaluation of the Young’s modu
Autor:
Neasung Lee, Woosuk Choi, Yongho Seo, Sang-Joon Cho, Imtisal Akhtar, Sunil Kumar, Kyung Ho Park, Malik Abdul Rehman, Hyeong-Ho Park
Publikováno v:
Applied Surface Science. 469:582-592
Three-dimensional (3D) imaging of nanostructures with high aspect ratio features is a challenging problem of broad relevance to nanoscience and nanotechnology. Though a wide variety of experimental strategies to improve 3D imaging capabilities have b
Publikováno v:
Microelectronic Engineering. 253:111676
Publikováno v:
International Symposium for Testing and Failure Analysis.
With decreasing device sizes, nanometer-sized defects on the wafer substrates can already limit the performance of the devices. The detection and precise classification of these defects requires additional characterization methods with a resolution i