Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Sang Kyun Nam"'
Autor:
Jun Hyun Chun, Sang-Jin Byeon, Han Ho Jin, Jin-Hee Cho, Kang Seol Lee, Jae-Jin Lee, Kwan-Weon Kim, Sung-Joo Hong, Kyung Whan Kim, Dong Uk Lee, Sang Kyun Nam
Publikováno v:
VLSIC
For the heterogeneous-structured high bandwidth memory (HBM) DRAM, it is important to guarantee the reliability of TSV connections. An exact TSV current scan and repair method is proposed, that uses similar to the correlated double sampling method. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::25da9d3125b3cf800317659df0c5b5af
https://doi.org/10.1109/vlsic.2014.6858368
https://doi.org/10.1109/vlsic.2014.6858368
Autor:
Dong Uk Lee, Kyung Whan Kim, Kwan Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sungjoo Hong
Publikováno v:
2014 Symposium on VLSI Circuits Digest of Technical Papers; 2014, p1-2, 2p