Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Sander M. Smits"'
Autor:
B. Kaleli, Raymond J. E. Hueting, N. van den Berg, P. Kuipers, Sander M. Smits, Jurriaan Schmitz
Publikováno v:
2016 International Conference on Microelectronic Test Structures (ICMTS), 164-167
STARTPAGE=164;ENDPAGE=167;TITLE=2016 International Conference on Microelectronic Test Structures (ICMTS)
STARTPAGE=164;ENDPAGE=167;TITLE=2016 International Conference on Microelectronic Test Structures (ICMTS)
In this work we present a measurement approach to determine the interface trap density in FinFETs as a function of their energy. It is based on the precise determination of the gate voltage dependent ideality factor of the subthreshold current in thi
Autor:
Jurriaan Schmitz, R.A.M. Wolters, Lis K. Nanver, Svetlana Nikolajevna Bystrova, Sander M. Smits, Johan Hendrik Klootwijk, Alexey Y. Kovalgin
Publikováno v:
Bystrova, S N, Smits, S M, Klootwijk, J H, Wolters, R A M, Kovalgin, A Y, Nanver, L K & Schmitz, J 2017, Dealing with leakage current in TLM and CTLM structures with vertical junction isolation . in 2017 International Conference of Microelectronic Test Structures, ICMTS 2017 ., 7954257, IEEE, 2017 International Conference of Microelectronic Test Structures, ICMTS 2017, Grenoble, France, 27/03/2017 . https://doi.org/10.1109/ICMTS.2017.7954257
Transmission line method (TLM) structures are often employed to extract contact resistivity between a metal and a doped semiconductor region. In this article we treat the situation where the doped region is junction-isolated from the substrate. The j
Publikováno v:
Journal of micromechanics and microengineering, 19(6), 065012-065018. Institute of Physics (IOP)
This paper presents a study on the dielectric behavior of SU-8 photoresist. We present measurements on the leakage current levels through SU-8 layers of varying thickness. The leakage current is dominated by thermionic emission. We have further deter
Autor:
V. Gromov, P. Colas, R. Kluit, J. Timmermans, M. Chefdeville, H. van der Graaf, Cora Salm, Fred Hartjes, Els Koffeman, Jan Visschers, V.M. Blanco Carballo, Y. Giomataris, Jurriaan Schmitz, Sander M. Smits
Publikováno v:
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 583(11), 42-48. Elsevier
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, Volume 583(1/issue 1):10.1016/j.nima.2007.08.199, 42-48. Elsevier
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, Volume 583(1/issue 1):10.1016/j.nima.2007.08.199, 42-48. Elsevier
The Gossip gaseous pixel detector is being developed for the detection of charged particles in extreme high radiation environments as foreseen close to the interaction point of the proposed super LHC. The detecting medium is a thin layer of gas. Beca
Autor:
Cora Salm, Jan Visschers, J. Timmermans, V.M. Blanco Carballo, M. Chefdeville, H. van der Graaf, Jurriaan Schmitz, Sander M. Smits
Publikováno v:
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 576(1):10.1016/j.nima.2007.01.108, 1-4. Elsevier
This paper presents the operational characteristics of several integrated Micromegas detectors. These detectors called InGrids are made by means of micro-electronic fabrication techniques. These techniques allow a large variety of detector geometry t
Publikováno v:
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 780, 100-106. Elsevier
In this paper we present thermal cycling experiments of GridPix radiation imaging detectors, in view of a potential application in a cryogenic experiment. The robustness of the GridPix detector is studied for various grid designs, as well as various
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a50539676f27c7eed36a5733d9e026a8
https://research.utwente.nl/en/publications/c529a0a9-1f3d-456e-80b0-c1292f4f5648
https://research.utwente.nl/en/publications/c529a0a9-1f3d-456e-80b0-c1292f4f5648
Autor:
M. Chefdeville, Sander M. Smits, Jurriaan Schmitz, D. Altpeter, Cora Salm, Antonius A.I. Aarnink, J. Timmermans, V.M. Blanco Carballo, Jan Visschers, H. Der Graaf
Publikováno v:
Proceedings of 32nd European Solid State Device Research Conference, 129-132
STARTPAGE=129;ENDPAGE=132;TITLE=Proceedings of 32nd European Solid State Device Research Conference
STARTPAGE=129;ENDPAGE=132;TITLE=Proceedings of 32nd European Solid State Device Research Conference
This paper presents the technology of a new microsystem consisting of a CMOS chip with integrated high voltage electrodes, to be used as a detector for ionizing radiation. Its application ranges from particle detection in nuclear and high-energy phys
Autor:
A. Berkien, X. Llopart, S. van der Putten, H. Verkooijen, Sander M. Smits, Antonius A.I. Aarnink, J. Visser, W.J.C. Koppert, N. De Groot, E. Berbee, H. van der Graaf, J. Timmermans, A. P. Colijn, Jan Visschers, A. Giganon, Jurriaan Schmitz, Axel König, Marten Bosma, N. Wyrsch, J. Rövekamp, F. Hartjes, B. van der Heijden, A. Fomaini, L. De Nooij, M. Fransen, Cora Salm, M. Campbell, I. Giomataris, T. Wijnen, N. van Bakel, D. San Segundo Bello, P. Jansweijer, M. van Beuzekom, P. Colas, W. Gotink, A.A. Aarts, Maximilien Chefdeville, Nigel Hessey
Publikováno v:
Modern Physics Letters A, 28(13):134002. World Scientific Publishing Co. Pte. Ltd.
Modern Physics Letters A, 28, 1340021(1)-1340021(7)
Modern Physics Letters A, 28, 13, pp. 1340021(1)-1340021(7)
Modern Physics Letters A, 28(28-13), 13400211-13400217. World Scientific Press
Modern Physics Letters A, 28, 1340021(1)-1340021(7)
Modern Physics Letters A, 28, 13, pp. 1340021(1)-1340021(7)
Modern Physics Letters A, 28(28-13), 13400211-13400217. World Scientific Press
In 2000, the requirements for a large TPC for experiments at a new linear collider were formulated. Both the GEM and Micromegas gas amplification systems had matured, such that they could be practically applied. With the Medipix chip, a pixel-segment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::971f7d0536284306bb080f925f59a258
https://dare.uva.nl/personal/pure/en/publications/the-gridpix-detector-history-and-perspective(31cf6c9d-2ed9-445e-a093-2719f4cf0623).html
https://dare.uva.nl/personal/pure/en/publications/the-gridpix-detector-history-and-perspective(31cf6c9d-2ed9-445e-a093-2719f4cf0623).html
Autor:
Sander M. Smits, Y. Giomataris, H. van der Graaf, Jurriaan Schmitz, M. Chefdeville, Jan Visschers, Erik H.M. Heijne, P. Colas, S. van der Putten, J. Timmermans, Cora Salm
Publikováno v:
Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005, 139-142
STARTPAGE=139;ENDPAGE=142;TITLE=Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 556(2):10.1016/j.nima.2005.11.065, 490-494. Elsevier
STARTPAGE=139;ENDPAGE=142;TITLE=Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005
Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment, 556(2):10.1016/j.nima.2005.11.065, 490-494. Elsevier
A technology for manufacturing an aluminium grid onto a silicon wafer has been developed. The grid is fixed parallel and precisely to the wafer (anode) surface at a distance of 50 \mum by means of insulating pillars. When some 400 V are applied betwe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ed78e5a42402f317eb71bf8bfcac96d
http://cds.cern.ch/record/893063
http://cds.cern.ch/record/893063
Publikováno v:
7th International symposium of Plasma Process-Induced Damage, 134-137
STARTPAGE=134;ENDPAGE=137;TITLE=7th International symposium of Plasma Process-Induced Damage
STARTPAGE=134;ENDPAGE=137;TITLE=7th International symposium of Plasma Process-Induced Damage
The leakage current of different drain-well diodes for plasma-charging protection has been simulated at high temperature. The simulation shows that the high ambient temperature, especially during plasma deposition process, enormously enhances the eff