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Autor:
Arijit Raychowdhury, Eric Soenen, Samuel M. Palermo, Christophe Antoine, Fa Foster Dai, Hua Wang, Alessandro Piovaccari
Publikováno v:
IEEE Solid-State Circuits Magazine. 15:95-97
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::923a94b9b6fffebe7b2d69923d733e3b
https://doi.org/10.1109/mssc.2022.3220049
https://doi.org/10.1109/mssc.2022.3220049
