Zobrazeno 1 - 2
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pro vyhledávání: '"Samuel E. Haarman"'
Publikováno v:
PLoS ONE, Vol 17, Iss 6 (2022)
Deformation measurement is a key process in traction force microscopy (TFM). Conventionally, particle image velocimetry (PIV) or correlation-based particle tracking velocimetry (cPTV) have been used for such a purpose. Using simulated bead images, we
Externí odkaz:
https://doaj.org/article/1f4fef02d7c344b5b5469733bac94871
Publikováno v:
PloS one. 17(6)
Deformation measurement is a key process in traction force microscopy (TFM). Conventionally, particle image velocimetry (PIV) or correlation-based particle tracking velocimetry (cPTV) have been used for such a purpose. Using simulated bead images, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06a12008135cece577bccff165541fad
https://pubmed.ncbi.nlm.nih.gov/35731725
https://pubmed.ncbi.nlm.nih.gov/35731725