Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Samuel D. Dynako"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 7, Pp 650-654 (2019)
Field emitters and microplasmas often use series resistors to mitigate the rapid increase in current density that reduces device stability. This paper investigates the impact of external resistance on the transition of electron emission mechanism as
Externí odkaz:
https://doaj.org/article/14098a2c263541ab9b97727a04bc92e4
Publikováno v:
2018 IEEE International Conference on Plasma Science (ICOPS).
The transition to microscale and smaller devices necessitates a more robust understanding of breakdown discharge mechanisms at these length scales where the conventional Paschen's law (PL) fails. Many “modified Paschen's laws1, 2” have been deriv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c66efff5611e1f6d3e1d211dc0488d57
https://doi.org/10.1109/icops35962.2018.9575457
https://doi.org/10.1109/icops35962.2018.9575457
Publikováno v:
Physics of Plasmas. 25:103505
Device miniaturization increases the importance of understanding and predicting gas breakdown and electrical discharge thresholds. At gap sizes on the order of ten microns at atmospheric pressure, field emission drives breakdown rather than Townsend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27c5d28fcb31d2591725427fc5d34b8e
https://doi.org/10.1063/1.5042270
https://doi.org/10.1063/1.5042270