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pro vyhledávání: '"Samuel C. Bayer"'
Autor:
Marc Heyns, Xiao Sun, Samuel C. Bayer, Davide Tierno, Seth King, Paul Wittendorp, Matthijn Dekkers, Christoph Adelmann, Iuliana Radu, Sven Van Elshocht
The microwave dielectric properties of (Ba0.1Pb0.9)(Zr0.52Ti0.48)O3 (BPZT) and ZnO thin films with thicknesses below were investigated. No significant dielectric relaxation was observed for both BPZT and ZnO up to 30 GHz. The intrinsic dielectric con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dd0355e1df238c2ee44b392753b8b27d
https://lirias.kuleuven.be/handle/123456789/625110
https://lirias.kuleuven.be/handle/123456789/625110
