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pro vyhledávání: '"Samuel Amsterdam"'
Autor:
Justin M. Hoffman, Niklas B. Thompson, Olaf Borkiewicz, Xiang He, Samuel Amsterdam, Zhu-lin Xie, Aaron Taggart, Karen L. Mulfort, Alex B. F. Martinson, Lin X. Chen, Uta Ruett, David M. Tiede
Publikováno v:
IUCrJ, Vol 11, Iss 1, Pp 120-128 (2024)
The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin film
Externí odkaz:
https://doaj.org/article/c928735c9517434d99c032ebff4ed28d
