Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Samseok Jang"'
Autor:
Jaihyung Won, Dongjin Byun, Jong-Sik Choi, Yeonhong Jee, Seungmoo Lee, Samseok Jang, Hyeon-deok Lee
Publikováno v:
Thin Solid Films. 519:6737-6740
Amorphous carbon layers (ACL) were deposited on Si (100) wafers by plasma enhanced chemical vapor deposition (PECVD) by using 1-hexene (C 6 H 12 ) as a carbon source for dry etch hard mask of semiconductor devices manufacturing process. The depositio
Publikováno v:
Thin Solid Films. 519:6863-6867
The undoped and fluorine doped gallium tin oxide composite films are prepared by an electron cyclotron resonance metal organic chemical vapor deposition. Characteristics of structural, optical and electrical properties of the fluorine doped gallium t
Epitaxial lateral overgrowth of GaN on sapphire substrates using in-situ carbonized photoresist mask
Publikováno v:
Journal of Crystal Growth. 326:200-204
Epitaxial lateral overgrowth (ELO) GaN samples were successfully grown on masked sapphire (0 0 0 1) substrates using an in-situ carbonized photoresist (PR) mask by a metalorganic chemical vapor deposition (MOCVD) method. The PR masks for the ELO proc
Autor:
Jong-Hyeob Baek, Kwangtaek Lee, Young-Moon Yu, Samseok Jang, Jaesang Lee, Dongjin Byun, Bum-Joon Kim, Seung-Jae Lee, Junggeun Jhin
Publikováno v:
Chemical Vapor Deposition. 16:80-84
An epitaxial, laterally-overgrown (ELOG) GaN layer is deposited on a Si(111) substrate using high-dose, N+ ion implantation. ELOG GaN is deposited on a Si(111) wafer with implantation stripes by metal-organic (MO) CVD. The GaN layer on the N+ ion-imp
Autor:
Samseok Jang, Sang-Il Kim, Kwangtaek Lee, Bum-Joon Kim, Jaesang Lee, Dongjin Byun, Junggeun Jhin
Publikováno v:
ECS Transactions. 25:169-174
Epitaxial lateral overgrowth (ELO) process has limited use in GaN devices due to the uneasiness of regrowth or the likeliness of contamination from the ELO mask, even though it is a method to reduce the dislocation density in GaN grown on sapphire su
Publikováno v:
Journal of the Korean Physical Society. 53:3033-3037
ZnO thin lms were deposited by using atomic layer deposition with a xed purging time of the DEZinc and the H2O sources of 8 sec and an injection time of 1 sec per source. The ZnO lms were formed in the temperature range from 30 C to 300 C. The micros
Autor:
Jae Sung Hur, Kyung Hoon Yoon, Samseok Jang, Jae Ho Yun, Dongjin Byun, Jung Bin Song, Chang-Sik Son, Jihye Kim
Publikováno v:
Journal of the Korean Physical Society. 53:442-445
Publikováno v:
Materials Research Bulletin. 47:2888-2890
The growth of three-dimensional ZnO hybrid structures by metal-organic chemical vapor deposition was controlled through their growth pressure and temperature. Vertically aligned ZnO nanorods were grown on c-plane of sapphire substrate at 600 °C and
Autor:
Samseok Jang, Dohan Lee, Jun-hyuck Kwon, Sang-il Kim, So young Yim, Jaesang Lee, Ji Hun Park, Dongjin Byun
Publikováno v:
Japanese Journal of Applied Physics. 51:115501
Autor:
Dongjin Byun, Samseok Jang, So Young Yim, Sang-Il Kim, Do-Han Lee, Jaesang Lee, Jun Hyuck Kwon, Ji Hun Park
Publikováno v:
Japanese Journal of Applied Physics. 51:115501
Epitaxial lateral overgrowth (ELO) a-plane GaN samples were successfully grown on masked sapphire (11̄02) substrates using an in-situ carbonized photoresist (PR) mask by a metalorganic chemical vapor deposition (MOCVD) method. The PR masks for the E