Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Sam Avasapian"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
While 2.5D and 3D solutions continue to drive advancements in the electronics packaging industry, challenges persist with their reliability and qualification. In this paper, we introduce a new technique that may prove valuable for nondestructive, in-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::855a22fad6b5cc04a424ad90a01a301c
https://doi.org/10.31399/asm.cp.istfa2022p0163
https://doi.org/10.31399/asm.cp.istfa2022p0163
Autor:
Warren A. Holmes, Hamlet Aghakians, Sam Avasapian, Ali Bahraman, Andrew Berg, Andrew Beyer, Ellen Boehmer, Robert Calvet, Stephanie Cheung, Ben Cho, Hyung Cho, Analia Cillis, Linda DelCastillo, Matt Dickie, Greg Delo, Mark Farris, Ali Feizi, Ned Ferraro, Lisa Fischer, Roger Foltz, Narineh Hambarsoumian, Keith Hong, Tsuwei Huang, Murzy Jhabvala, Eric Kan, Robert Kopp, Bruce Krohn, Don Lewis, Markus Loose, Kristen MacNeal, Jessica Maiten, Donna Markley, Gustavo Maldonado, Jitendra Mehta, Johnny Melendez, Ronald Morgan, Jerry Mulder, Manh Nguyen, Nazia Ovee, Moshe Pniel, Steven Pravdo, David Randall, Joseph Riendeau, Allan Runkle, Marcus Runyan, Michael Seiffert, Anders Skalare, Patricia Tan, Anthony Turner, Steven Van Nostrand, Augustyn Waczynski, Jay Wu
Publikováno v:
X-Ray, Optical, and Infrared Detectors for Astronomy X.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e209c4af1df4d460f0caa765f4af2d75
https://doi.org/10.1117/12.2629611
https://doi.org/10.1117/12.2629611