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pro vyhledávání: '"Salomons, M. H."'
Autor:
Mutus, J. Y., Livadaru, L., Robinson, J. T., Urban, R., Salomons, M. H., Cloutier, M., Sheehan, P. E., Wolkow, R. A.
Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of graphene is meas
Externí odkaz:
http://arxiv.org/abs/1102.1758
