Quantum Mechanical Capacitance in a Scanning Tunneling Microscope

Autor: Botkin, D., Weiss, S., Ogletree, D.F., Salmeron, E.M., Chemla, D.S.

Publikováno v: Botkin, D.; Weiss, S.; Ogletree, D.F.; Salmeron, E.M.; & Chemla, D.S.(1995). Quantum Mechanical Capacitance in a Scanning Tunneling Microscope. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/0tj0p6k7

One of the most spectacular manifestations of quantum mechanics is tunneling between closely spaced conductors. The DC I-V characteristics in different types of tunnel junctions, such as metal-vacuum-metal junctions (MVM), metal-insulator-metal junct

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6335a60a58ef3e3f65dc1951915edd39
https://doi.org/10.1364/qo.1995.qwa3

Atomic Scale Interface Structure of In{sub 0.2}Ga{sub 0.8}As/GaAs Strained Layers Studied By Cross-Sectional Scanning Tunneling Microscopy

Autor: Zheng, J.F., Salmeron, E.M., Weber, E.R.

Publikováno v: Zheng, J.F.; Salmeron, E.M.; & Weber, E.R.(1993). Atomic Scale Interface Structure of In{sub 0.2}Ga{sub 0.8}As/GaAs Strained Layers Studied By Cross-Sectional Scanning Tunneling Microscopy. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/5w69g0k0

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::ca4a1e7a31436df1f591ee4fc9897414
http://www.escholarship.org/uc/item/5w69g0k0

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

The Present State of Understanding of the Role of Sulfur in Modifying the Friction and Lubricity of Metal Surfaces

Autor: Somorjai, Gabor A., Salmeron, E.M.

Publikováno v: Somorjai, Gabor A.; & Salmeron, E.M.(1991). The Present State of Understanding of the Role of Sulfur in Modifying the Friction and Lubricity of Metal Surfaces. Surface Science. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/4n13v905

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::bf377ab1f0d54f63f0bc151667fc5f5d
http://www.escholarship.org/uc/item/4n13v905

Preparation and Characterization of Amorphous SiC:H Thin Films

Autor: Delplancke, M.P., Powers, J.M., Vandentop, G.J., Salmeron, E.M., Somorjai, Gabor A.

Publikováno v: Delplancke, M.P.; Powers, J.M.; Vandentop, G.J.; Salmeron, E.M.; & Somorjai, Gabor A.(1990). Preparation and Characterization of Amorphous SiC:H Thin Films. Journal of vacuum science and technology A, 9(3). Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/3k51109z

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::cfd05694952b399c80ebe9f9f6da2780
http://www.escholarship.org/uc/item/3k51109z