Výsledky vyhledávání

Applying Density-based Clustering for Bloodstain Pattern Analysis

Autor: Acampora G., Nunzio C. D., Garofano L., Saliva M., Vitiello A.

Publikováno v: 2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC).

Bloodstain Pattern Analysis (BPA) is used by forensic officers to analyse bloodstains left at crime scenes. As a consequence, it has a crucial role in the investigations of bloody crimes. Currently, BPA activities are performed manually by leading to

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dd281f7c57a3242da413bde43c813ceb
https://doi.org/10.1109/smc52423.2021.9659004

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Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI

Autor: Saliva, M., Cacho, F., Huard, V., Federspiel, X., Angot, D., Benhassain, A., Bravaix, A., Anghel, L.

Publikováno v: Design, Automation & Test in Europe Conference & Exhibition (DATE'15)
Design, Automation & Test in Europe Conference & Exhibition (DATE'15), Mar 2015, Grenoble, France. pp.441-446

International audience; Aging induced degradation mechanisms occurring in digital circuits are of a greater importance in the latest technologies. Monotonic degradation such as Bias Temperature Instability (BTI) or Hot Carrier Injection (HCI) but als

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85df9572f42691adac43d3e8457cd032
https://hal.archives-ouvertes.fr/hal-01400582

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New Insight about Oxide Breakdown Occurrence at Circuit Level

Autor: Saliva, M., Cacho, F., Huard, V., Angot, D., Durand, M., Federspiel, X., Parra, M., Bravaix, A., Anghel, Lorena, Blanc-Benon, P.

Publikováno v: IEEE International Reliability Physics Symposium (IRPS'14)
IEEE International Reliability Physics Symposium (IRPS'14), Jun 2014, Waikoloa, HI, United States

International audience; Lifetime extension based on device level parameters dr ift is difficult to handle, an accurate BD model is thus mandatory for predictive simulation at circuit leve l. For the first time, a dedicated digital circuit has been de

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9d6c5bf0204bb1a5cba3763aa8434762
https://hal.archives-ouvertes.fr/hal-01128363

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Conference

Timing in-situ monitors: Implementation strategy and applications results.

Autor: Benhassain, A., Cacho, F., Huard, V., Saliva, M., Anghel, L., Parthasarathy, C., Jain, A., Giner, F.

Publikováno v: 2015 IEEE Custom Integrated Circuits Conference (CICC); 2015, p1-4, 4p

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Diversità e criteri di valutazione del danno alla persona in ambito CEE

Autor: Sciaudone, G, Crisci, Antonello, Laurenza, A, Saliva, M.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______3666::bc767a7e86e45db77f31115be6cbb858
http://hdl.handle.net/11386/3098489

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Conference

Dielectric breakdown in high-K metal gate: Measurement, device level model and application to circuit.

Autor: Cacho, F., Angot, D., Saliva, M., Mora, P., Rafik, M., Federspiel, X., Roy, D., Huard, V.

Publikováno v: 2012 IEEE International Integrated Reliability Workshop Final Report; 1/ 1/2012, p140-143, 4p

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Conference

Technology scaling and reliability: Challenges and opportunities.

Autor: Huard, V., Cacho, F., Federspiel, X., Arfaoui, W., Saliva, M., Angot, D.

Publikováno v: 2015 IEEE International Electron Devices Meeting (IEDM); 1/1/2015, p1.6-20.5.6, 0p

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