Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Salih Çölmekçi"'
Publikováno v:
Korean Journal of Chemical Engineering. 39:1946-1951
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e55c2884750cfab9db74a5ff50eb458
https://doi.org/10.1007/s11814-021-0998-7
https://doi.org/10.1007/s11814-021-0998-7
Publikováno v:
Journal of Superconductivity and Novel Magnetism. 33:463-472
This study contains parametric characterizations of four different series of Fe/Al multilayer thin films sputtered under thicknesses of Al layers (7.5, 35 and 95 nm), deposition rates (0.02 and 0.06 nm/s), Fe layer thicknesses (7.5, 12.5 and 27.5 nm)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::589ba8b56bef7573c72e970a00af0ae0
https://doi.org/10.1007/s10948-019-05207-4
https://doi.org/10.1007/s10948-019-05207-4
Publikováno v:
Journal of Magnetism and Magnetic Materials. 478:48-54
In this study, the impact of total film thicknesses on the structural and magnetic properties of multilayers was investigated. The multilayer films were produced by a DC magnetron sputtering system by considering different total thickness values as x
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21a32794fd9a79e455c6fe504d5213b4
https://doi.org/10.1016/j.jmmm.2019.01.086
https://doi.org/10.1016/j.jmmm.2019.01.086
Publikováno v:
Zeitschrift für Naturforschung A. 73:85-90
Çölmekçi, Salih (Balikesir Author)
The structural and corresponding magnetic properties of Ni/Cu films sputtered at low and high deposition rates were investigated as there is a limited number of related studies in this field. 5[Ni(10 nm)/Cu(
The structural and corresponding magnetic properties of Ni/Cu films sputtered at low and high deposition rates were investigated as there is a limited number of related studies in this field. 5[Ni(10 nm)/Cu(
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c91c8d381a7efe861e4d839a9f9fb97b
https://doi.org/10.1515/zna-2017-0207
https://doi.org/10.1515/zna-2017-0207
Publikováno v:
Thin Solid Films. 727:138661
In this study, Ni/Cu thin films with Cu layer thicknesses varying from 200 nm to absence of Cu (0 nm) were produced by using a magnetron sputtering technique in order to investigate their structural and magnetic properties. The X-ray diffraction anal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52ac2805de8de20ff85518e76b7356ad
https://doi.org/10.1016/j.tsf.2021.138661
https://doi.org/10.1016/j.tsf.2021.138661