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Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors

Autor: Yves Danto, Yves Ousten, Bernard Tregon, Laurent Bechou, Said Mejdi

Publikováno v: Quality and Reliability Engineering International. 14:91-94

SUMMAKY In this paper we present a comparison between two non-destructive techniques for crack detection in MLCCs. First, if a type II MLCC is biased with a DC field, the capacitor becomes temporarily 'poled' and can act as a transducer. This is indu

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7fd68c6ddf9657cb9c5d17e48bfcac3
https://doi.org/10.1002/(sici)1099-1638(199803/04)14:2<91::aid-qre167>3.0.co

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Nondestructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances

Autor: Laurent Bechou, Said Mejdi, Yves Danto, Yves Ousten

High reliability multilayer ceramic chip capacitors are necessary for use in surface mounting processes which are more mechanically and thermally severe than the traditional through-hole processes. Moreover, in specific environments, even a small def

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05656c5a3682d335319cecda21b99ab0
https://hal.archives-ouvertes.fr/hal-00164916

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