Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sai Hooi Yeong"'
Autor:
Yan-Kui Liang, Jing-Wei Lin, Li-Chi Peng, Yi Miao Hua, Tsung-Te Chou, Chi-Chung Kei, Chun-Chieh Lu, Huai-Ying Huang, Sai Hooi Yeong, Yu-Ming Lin, Po-Tsun Liu, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Transactions on Electron Devices. 70:1067-1072
Autor:
Yan-Kui Liang, Wei-Li Li, Yong-Jyun Wang, Li-Chi Peng, Chun-Chieh Lu, Huai-Ying Huang, Sai Hooi Yeong, Yu-Ming Lin, Ying-Hao Chu, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Electron Device Letters. 43:1451-1454
Autor:
Yan-Kui Liang, Yi-Shuo Huang, Li-Chi Peng, Tsung-Ying Yang, Bo-Feng Young, Chun-Chieh Lu, Sai Hooi Yeong, Yu-Ming Lin, Chun-Jung Su, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Transactions on Nanotechnology. 21:328-331
Autor:
Yan-Kui Liang, Jing-Wei Lin, Yi-Shuo Huang, Wei-Cheng Lin, Bo-Feng Young, Yu-Chuan Shih, Chun-Chieh Lu, Sai Hooi Yeong, Yu-Ming Lin, Po-Tsun Liu, Edward Yi Chang, Chun-Hsiung Lin
Publikováno v:
ECS Journal of Solid State Science and Technology. 11:053012
In this work, we investigated the ferroelectric properties of Hf0.5Zr0.5O2 (HZO) Metal-Ferroelectric-Metal (MFM) capacitors on various refractory electrodes, including TiN, TaN, W, and Mo. By comparing different electrodes and annealing temperature,
Autor:
Edmund G. Seebauer, Sai Hooi Yeong, M P Srinivasan, Charlotte Kwok, Ramakrishnan Vaidyanathan, Benjamin Colombeau, L. Chan
Publikováno v:
ECS Meeting Abstracts. :598-598
not Available.