Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Sai Hooi Yeong"'
Autor:
Yan-Kui Liang, Jing-Wei Lin, Li-Chi Peng, Yi Miao Hua, Tsung-Te Chou, Chi-Chung Kei, Chun-Chieh Lu, Huai-Ying Huang, Sai Hooi Yeong, Yu-Ming Lin, Po-Tsun Liu, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Transactions on Electron Devices. 70:1067-1072
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b4ac72da8495813643d76612e97fe09
https://doi.org/10.1109/ted.2022.3232476
https://doi.org/10.1109/ted.2022.3232476
Autor:
Yan-Kui Liang, Wei-Li Li, Yong-Jyun Wang, Li-Chi Peng, Chun-Chieh Lu, Huai-Ying Huang, Sai Hooi Yeong, Yu-Ming Lin, Ying-Hao Chu, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Electron Device Letters. 43:1451-1454
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::249dfed6780dd69102396a36b4138763
https://doi.org/10.1109/led.2022.3193383
https://doi.org/10.1109/led.2022.3193383
Autor:
Yan-Kui Liang, Yi-Shuo Huang, Li-Chi Peng, Tsung-Ying Yang, Bo-Feng Young, Chun-Chieh Lu, Sai Hooi Yeong, Yu-Ming Lin, Chun-Jung Su, Edward-Yi Chang, Chun-Hsiung Lin
Publikováno v:
IEEE Transactions on Nanotechnology. 21:328-331
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d6a937beaf4f92c5c5236658635e4897
https://doi.org/10.1109/tnano.2022.3187589
https://doi.org/10.1109/tnano.2022.3187589
Autor:
Yan-Kui Liang, Jing-Wei Lin, Yi-Shuo Huang, Wei-Cheng Lin, Bo-Feng Young, Yu-Chuan Shih, Chun-Chieh Lu, Sai Hooi Yeong, Yu-Ming Lin, Po-Tsun Liu, Edward Yi Chang, Chun-Hsiung Lin
Publikováno v:
ECS Journal of Solid State Science and Technology. 11:053012
In this work, we investigated the ferroelectric properties of Hf0.5Zr0.5O2 (HZO) Metal-Ferroelectric-Metal (MFM) capacitors on various refractory electrodes, including TiN, TaN, W, and Mo. By comparing different electrodes and annealing temperature,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::292b26ab1d9b4e776a1ce7c4e21bbb43
https://doi.org/10.1149/2162-8777/ac6f1c
https://doi.org/10.1149/2162-8777/ac6f1c
Autor:
Edmund G. Seebauer, Sai Hooi Yeong, M P Srinivasan, Charlotte Kwok, Ramakrishnan Vaidyanathan, Benjamin Colombeau, L. Chan
Publikováno v:
ECS Meeting Abstracts. :598-598
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76b7f77a0b1a18fe0064ebd659ef4bed
https://doi.org/10.1149/ma2007-01/12/598
https://doi.org/10.1149/ma2007-01/12/598
Autor:
Liang, Yan-Kui, Li, Wei-Li, Wang, Yong-Jyun, Peng, Li-Chi, Lu, Chun-Chieh, Huang, Huai-Ying, Yeong, Sai Hooi, Lin, Yu-Ming, Chu, Ying-Hao, Chang, Edward-Yi, Lin, Chun-Hsiung
Publikováno v:
IEEE Electron Device Letters; Sep2022, Vol. 43 Issue 9, p1451-1454, 4p
Autor:
Yu, Zhouchangwan, Saini, Balreen, Liao, Pei‐Jean, Chang, Yu‐Kai, Hou, Duen‐Huei, Nien, Chih‐Hung, Shih, Yu‐Chuan, Yeong, Sai Hooi, Afanas'ev, Valeri, Huang, Fei, Baniecki, John D., Mehta, Apurva, Chang, Chih‐Sheng, Wong, H.‐S. Philip, Tsai, Wilman, McIntyre, Paul C.
Publikováno v:
Advanced Electronic Materials; Jul2022, Vol. 8 Issue 7, p1-8, 8p
Autor:
Liang, Yan-Kui, Lin, Jing-Wei, Huang, Yi-Shuo, Lin, Wei-Cheng, Young, Bo-Feng, Shih, Yu-Chuan, Lu, Chun-Chieh, Yeong, Sai Hooi, Lin, Yu-Ming, Liu, Po-Tsun, Chang, Edward Yi, Lin, Chun-Hsiung
Publikováno v:
ECS Journal of Solid State Science & Technology; May2022, Vol. 11 Issue 5, p155-160, 6p
Publikováno v:
Applied Physics Letters; 10/9/2006, Vol. 89 Issue 15, p152114, 3p, 1 Chart, 3 Graphs
Autor:
Mittal, K. L.
This book is mostly based on papers presented at the Fourth International Symposium on this topic held in Savannah, Georgia. However, in addition to these papers, certain very relevant papers have also been included to broaden the scope and thus enha
