Zobrazeno 1 - 10
of 764
pro vyhledávání: '"Sahoo, N. K."'
Autor:
Tokas, R. B., Jena, S., Mishal, J. S., Rao, K. Divakar, Polaki, S. R., Pratap, C., Udupa, D. V., Thakur, S., Kumar, Sanjiv, Sahoo, N. K.
In the present work, a set of ZrO2 thin films have been deposited at 82 degree angle of deposition at several substrate rotation speeds and at 0 degree. The effect of substrate rotation on optical, structural, morphological properties and residual st
Externí odkaz:
http://arxiv.org/abs/1612.02627
Oblique angle deposited oxide thin films have opened up new dimensions in fabricating optical interference devices with tailored refractive index profile along thickness by tuning its microstructure by varying angle of deposition. Microstructure of t
Externí odkaz:
http://arxiv.org/abs/1510.07378
Oblique angle deposition of oxides is being famous for fabricating inhomogeneous thin films with variation of refractive index along thickness in a functional form. Inhomogeneous layers play a key role in the development of rugate interference device
Externí odkaz:
http://arxiv.org/abs/1406.6858
Publikováno v:
Indian J Phys 90 (2016) 951
ZrO2:10%SiO2 thinfilms have been deposited on fused silica substrate by reactive electron beam co-evaporation technique at different oxygen partial pressure. The structural analysis shows tetragonal phase with residual tensile stress in the films. Th
Externí odkaz:
http://arxiv.org/abs/1403.4794
Publikováno v:
International Journal of Bio-Resource & Stress Management. Aug2021, Vol. 12 Issue 4, p286-294. 9p.
Autor:
Sahoo, N. K., Thakral, Ankur, Pandey, Swati, Vaswani, Himani, Vashisht, Sahil, Maheshwari, Isha
Publikováno v:
Journal of Maxillofacial & Oral Surgery; Jun2024, Vol. 23 Issue 3, p581-588, 8p
Publikováno v:
Investigación Operacional. 2019, Vol. 40 Issue 5, p624-637. 14p. 8 Charts, 7 Graphs.
Publikováno v:
Journal of Maxillofacial & Oral Surgery; Dec2023, Vol. 22 Issue 4, p1078-1082, 5p
Publikováno v:
FRPT- Finance Snapshot. 6/6/2016, p50-51. 2p.
Autor:
Parameswarappa D. C., Arora S., Singh S. R., Sahoo N. K., Maltsev D. S., Kulikov A. N., Iovino C., Tatti F., Venkatesh R., Zaheer H., Reddy N. G., Pulipaka R. S., Peiretti E., Chhablani J.
In the original published article, one of the author names has been misspelled. “Ramesh Vankatesh” should be “Ramesh Venkatesh” This is being corrected in this publication.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3977::262eda37a2d6a44c08af529359628e63
http://hdl.handle.net/11591/461566
http://hdl.handle.net/11591/461566