Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Sagar Saxena"'
Autor:
Neal Lafferty, Sagar Saxena, Keisuke Mizuuchi, Yuansheng Ma, Xima Zhang, Pat Lacour, Alex Tritchkov, Farah Huq Kmiec, John Sturtevant
Publikováno v:
DTCO and Computational Patterning II.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b658ffaf767d052f91daf8f9d4e205b
https://doi.org/10.1117/12.2647882
https://doi.org/10.1117/12.2647882
Publikováno v:
Journal of Orthopaedic Case Reports. 12:1-4
Introduction: Ischium is one of the rare sites to be involved by mycobacterium tuberculosis. The incidence is generally not more than 0.2% in any of the large series. We report an unusual case of extrapulmonary tuberculosis of the ischial tuberosity
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1582bddd93421b906ecec68fb8ce7d83
https://doi.org/10.13107/jocr.2022.v12.i07.2890
https://doi.org/10.13107/jocr.2022.v12.i07.2890
Publikováno v:
Journal of Parallel and Distributed Computing. 139:148-160
Computing platforms ranging from embedded systems to server blades comprise of multiple Systems-on-Chips (SoCs). Conventionally, communication between chips in these multichip platforms are realized using high-speed I/O modules over metal traces on a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a35e86ab14194ab4a1a0718cad3a58fd
https://doi.org/10.1016/j.jpdc.2020.02.002
https://doi.org/10.1016/j.jpdc.2020.02.002
Autor:
Sagar Saxena, K. Nimala
Publikováno v:
Proceedings of International Conference on Deep Learning, Computing and Intelligence ISBN: 9789811656514
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::766ad269a98b9aeb176a4349c35cc646
https://doi.org/10.1007/978-981-16-5652-1_34
https://doi.org/10.1007/978-981-16-5652-1_34
Autor:
Amlan Ganguly, M. Meraj Ahmed, Rounak Singh Narde, Abhishek Vashist, Md Shahriar Shamim, Naseef Mansoor, Tanmay Shinde, Suryanarayanan Subramaniam, Sagar Saxena, Jayanti Venkataraman, Mark Indovina
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 8, Iss 1, p 5 (2018)
With aggressive scaling of device geometries, density of manufacturing faults is expected to increase. Therefore, yield of complex Multi-Processor Systems-on-Chips (MP-SoCs) will decrease due to higher probability of manufacturing defects especially,
Externí odkaz:
https://doaj.org/article/3fd976ca928a47e2b1c8453a6b08bab9
Autor:
Shresth Garg, Sagar Saxena
Publikováno v:
SSRN Electronic Journal.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::478f785559f52cb6bb65c294a4a49ad2
https://doi.org/10.2139/ssrn.3997979
https://doi.org/10.2139/ssrn.3997979
Publikováno v:
Indian Journal of Surgery. 83:949-950
We file an unprecedented case of a 25-year-old gentleman, with live extra-lymphatic filarial infestation presenting as multiple fleeting subcutaneous swellings. The patient was under regular review by a dermatologist and was being managed as a case o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc8055713127cb0f40f190e39b2d873c
https://doi.org/10.1007/s12262-021-03004-9
https://doi.org/10.1007/s12262-021-03004-9
Publikováno v:
Electronic Imaging. 29:20-26
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d33c85f2ef45d43b594e3852c472591
https://doi.org/10.2352/issn.2470-1173.2017.10.imawm-162
https://doi.org/10.2352/issn.2470-1173.2017.10.imawm-162
Autor:
Ruta M Kulkarni, Sujay M. Kulkarni, Yadwinder Saini, Rajiv Negandhi, Sagar Saxena, Nitish Arora
Publikováno v:
Journal of pediatric orthopedics. 39(9)
Fibular hemimelia is the most common deficiency involving the long bones. Paley classification is based on the ankle joint morphology, identifies the basic pathology, and helps in planning the surgical management. Reconstruction surgery encompasses f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a4c51c66a7cddb23756da017298a40af
https://pubmed.ncbi.nlm.nih.gov/31503232
https://pubmed.ncbi.nlm.nih.gov/31503232
Autor:
M Meraj Ahmed, Rounak Singh Narde, Jayanti Venkataraman, Amlan Ganguly, Mark Indovina, Naseef Mansoor, Tanmay Shinde, Sagar Saxena, Shamim, Suryanarayanan Subramaniam, Abhishek Vashist
Publikováno v:
Journal of Low Power Electronics and Applications; Volume 8; Issue 1; Pages: 5
Journal of Low Power Electronics and Applications, Vol 8, Iss 1, p 5 (2018)
Journal of Low Power Electronics and Applications, Vol 8, Iss 1, p 5 (2018)
With aggressive scaling of device geometries, density of manufacturing faults is expected to increase. Therefore, yield of complex Multi-Processor Systems-on-Chips (MP-SoCs) will decrease due to higher probability of manufacturing defects especially,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::af187ddb3bd018c889a1e8e59731154e