Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Saeed Saghafi"'
Publikováno v:
IET Science, Measurement & Technology. 14:557-563
This study presents a probabilistic approach, based on the finite element method (FEM), to model insulator flashover and calculate the failure risk of insulators under contaminated conditions. In the proposed method, the voltage distribution along th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6b10b53cfb4fd225503717106c80b306
https://doi.org/10.1049/iet-smt.2019.0179
https://doi.org/10.1049/iet-smt.2019.0179
