Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sae Nagai"'
Publikováno v:
Physical Review Materials. 5
We used $p$-polarized multiple-angle incidence resolution spectrometry (pMAIRS) to investigate a collective orientation barrier (COB) in the growth of organic semiconductor (OSC) films. We demonstrate a temperature-dependent variation in the growth o
Publikováno v:
Applied Physics Express. 15:015502
The temperature-dependent molecular orientation variation of pentacene (PEN) on a graphene-covered substrate (PEN/Gr) was investigated via p-polarized multiple-angle incidence resolution spectrometry (pMAIRS). The temperature regime of the orientatio
Publikováno v:
Vibrational Spectroscopy. 72:66-71
The state of dye adsorption on TiO 2 electrodes in dye-sensitized solar-cell (DSSC) systems is important for its power-conversion efficiency (PCE). We propose a non-destructive and quantitative method to evaluate the amount of adsorbed dye on TiO 2 e
Publikováno v:
Composite Interfaces. 16:13-25
A developed nanomechanical analysis of atomic force microscopy (AFM) based on the JKR theory has been applied to butyl rubber; isoprene-co-isobutylene rubber (IIR, butyl rubber). The force–deformat...
Autor:
Shinji Hayazaki, Toshiyuki Kobayashi, Yosuke Murakami, Bando Masashi, Sae Nagai, Nobuhiko Umezu, Koji Kadono, Yukiko Mizuguchi, Daisuke Hobara, Kazuhiko Miyahara, Keisuke Shimizu, Nozomi Kimura
Publikováno v:
Applied Physics Letters. 102:023112
A high-quality graphene transparent conductive film was fabricated by roll-to-roll chemical vapor deposition (CVD) synthesis on a suspended copper foil and subsequent transfer. While the high temperature required for the CVD synthesis of high-quality
Publikováno v:
ResearcherID
Nanomechanical mapping by atomic force microscopy (AFM) has been developed as the useful application to measure the physical properties of soft materials at nano-meter scale. To date, the Hertz theory was used for analyzing force-distance curves as t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::300a28fa9011d1741f94027d2ce874d9
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000255183300005&KeyUID=WOS:000255183300005
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000255183300005&KeyUID=WOS:000255183300005