Zobrazeno 1 - 10
of 119
pro vyhledávání: '"Sadeghian, Hamed"'
Autor:
Piras, Daniele, Sadeghian, Hamed
Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image contrast. Therefore, to analyze the image contrast, the local changes
Externí odkaz:
http://arxiv.org/abs/1701.07357
Autor:
Sadeghian, Hamed
The electrostatic pull-in instability (EPI), within the framework of the nanoelectromechanical systems (NEMS) has been shown as a robust and versatile method for characterizing mechanical properties of nanocantilevers. This paper aims to investigate
Externí odkaz:
http://arxiv.org/abs/1611.02222
Autor:
Bijnagte, Tom, Kramer, Geerten, Kramer, Lukas, Dekker, Bert, Herfst, Rodolf, Sadeghian, Hamed
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes damages t
Externí odkaz:
http://arxiv.org/abs/1610.03471
Autor:
Page, Michael, Ma, Yiqiu, Zhao, Chunnong, Blair, David, Ju, Li, Pan, Huang-Wei, Chao, Shiuh, Mitrofanov, Valery, Sadeghian, Hamed
Thermal noise generally greatly exceeds quantum noise in optomechanical devices unless the mechanical frequency is very high or the thermodynamic temperature is very low. This paper addresses the design concept for a novel optomechanical device capab
Externí odkaz:
http://arxiv.org/abs/1602.03621
Autor:
Sendelbach, Matthew J., Schuch, Nivea G., Mukherjee, Dipankar, Sadeghian, Hamed, Nijmeijer, Henk
Publikováno v:
Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129550Q-129550Q-13, 12825464p
Autor:
Sendelbach, Matthew J., Schuch, Nivea G., Mukherjee, Dipankar, Hoogesteger, Marinus, Sadeghian, Hamed, Nijmeijer, Henk
Publikováno v:
Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129550J-129550J-11, 12825462p
Autor:
Sharahi, Hossein J., Janmaleki, Mohsen, Tetard, Laurene, Kim, Seonghwan, Sadeghian, Hamed, Verbiest, Gerard J.
Publikováno v:
Journal of Applied Physics; 1/21/2021, Vol. 129 Issue 3, p1-21, 21p
Autor:
Mucientes, Marta, Khachaturiants, Artem, Trussell, Robert, Kalinin, Arseniy, Guo, Yan, Simons, Erik C., Kim, Seokhan, Nadyarnykh, Oleg, Moussa, Alain, Bogdanowicz, Janusz, Severi, Joren, Lorusso, Gian, De Simone, Danilo, Charley, Anne-Laure, Leray, Philippe, van Reijzen, Maarten E., Bozdog, Cornel, Sadeghian, Hamed
Publikováno v:
Photomask Japan 2022: XXVIII Symposium on Photomask and Next-Generation Lithography Mask Technology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::133e3163205e108878b907e1576344a0
https://doi.org/10.1117/12.2641698
https://doi.org/10.1117/12.2641698
Akademický článek
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Autor:
Khatchaturiants, Artem, Mucientes, Marta, Kalinin, Arseniy, Guo, Yan, Kim, Seokhan, Moussa, Alain, Bogdanowicz, Janusz, Severi, Joren, Lorusso, Gian F., De Simone, Danilo, Charley, Anne-Laure, Leray, Philippe, van Reijzen, Maarten E., Bozdog, Cornel, Sadeghian, Hamed M.
Publikováno v:
Metrology, Inspection, and Process Control XXXVI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17d04b7f17b85e7710b32ad944974416
https://doi.org/10.1117/12.2616089
https://doi.org/10.1117/12.2616089