Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Sachin Kumar Bhoi"'
Autor:
Farzad Hosseinabadi, Sajib Chakraborty, Sachin Kumar Bhoi, Guenter Prochart, Dino Hrvanovic, Omar Hegazy
Publikováno v:
IEEE Open Journal of Power Electronics, Vol 5, Pp 473-512 (2024)
Power electronics converters (PECs) are responsible for efficiently converting electrical energy between power generators, storage systems and power consumers/loads. The PECs are subjected to complicated power loading factors throughout their operati
Externí odkaz:
https://doaj.org/article/512b601034a44ff1a93ce38d50c2ecbf
Autor:
Steven Robyns, Stijn Helsen, Sam Weckx, Sachin Kumar Bhoi, Mohamed El Baghdadi, Omar Hegazy, Jasper De Smet
Publikováno v:
Procedia Computer Science. 217:709-719
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::55bffab7818ab253a8eaf211a801cd6a
https://doi.org/10.1016/j.procs.2022.12.267
https://doi.org/10.1016/j.procs.2022.12.267
Autor:
Farzad Hosseinabadi, Hakan Polat, Gamze Egin Martin, Sachin Kumar Bhoi, Sajib Chakraborty, Thomas Geury, Mohamed El Baghdadi, Omar Hegazy
Publikováno v:
IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society
In this paper, an advanced method for implementing active thermal control is proposed that can be helpful for smoothing repetitive junction temperature swing, which is one of the main reasons for wear-out failure in Wide bandgap (WBG)-based (i.e., Si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c3a13dcbdf669750a692481a3ce84811
https://doi.org/10.1109/iecon49645.2022.9968793
https://doi.org/10.1109/iecon49645.2022.9968793
Autor:
Sachin Kumar Bhoi, Sajib Chakraborty, Boud Verbrugge, Stijn Helsen, Steven Robyns, Mohamed El Baghdadi, Omar Hegazy
In large-scale industrial machine applications (IMAs) during condition monitoring, all sensor devices can produce raw data up to 15TB of data/week. Transmitting these large high-frequency data sets to the cloud to closely monitor the operational envi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e97e02123cdac19dc959d3521c0c0ab6
https://doi.org/10.1109/speedam53979.2022.9841966
https://doi.org/10.1109/speedam53979.2022.9841966
Publikováno v:
Vrije Universiteit Brussel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::01bfb1c3706754c29293d02e191c11d8
https://researchportal.vub.be/en/publications/bdd1235f-77df-4e3c-a23e-eab28a0be0f5
https://researchportal.vub.be/en/publications/bdd1235f-77df-4e3c-a23e-eab28a0be0f5
Autor:
Farzad Hosseinabadi, SHAHID JAMAN, SACHIN KUMAR BHOI, Md Mahamudul Hasan, Sajib Chakraborty, Mohamed El Baghdadi, Omar Hegazy
Publikováno v:
Vrije Universiteit Brussel
This paper presents an advanced methodology for mapping junction temperature ( Tj ) based on the drain to source resistance ( Rds,on ) of a SiC MOSFET module to monitor the power electronics converter health condition. Capturing real-time measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::70041bc15669645c68b564dc376a1b7d
https://researchportal.vub.be/en/publications/9a2aa49e-33d2-4a1d-bf13-be51eb68b215
https://researchportal.vub.be/en/publications/9a2aa49e-33d2-4a1d-bf13-be51eb68b215