Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Sachiko Jonai"'
Autor:
Sachiko Jonai, Atsushi Masuda
Publikováno v:
AIP Advances, Vol 8, Iss 11, Pp 115311-115311-8 (2018)
This paper presented whether Na ion in the front cover glass is absolute root cause of potential-induced degradation (PID) for p-type crystalline Si photovoltaic (PV) modules or not. P-type monocrystalline Si PV modules with and without the front cov
Externí odkaz:
https://doaj.org/article/3254ba4bf0f544a7a31850be516f786c
Publikováno v:
Nanoscale Advances; 7/21/2024, Vol. 6 Issue 14, p3494-3512, 19p
Autor:
Seira Yamaguchi, Sachiko Jonai, Kyotaro Nakamura, Kazuhiro Marumoto, Yoshio Ohshita, Atsushi Masuda
Publikováno v:
ACS Omega. 7:36277-36285
For SiO
Autor:
Yasuaki Ishikawa, Atsushi Masuda, Sachiko Jonai, Kyotaro Nakamura, Yukiharu Uraoka, Dong C. Nguyen
Publikováno v:
Solar Energy. 199:55-62
A mechanism of potential induced degradation (PID) delay effect by ultraviolet (UV) light irradiation during PID test for p-type crystalline silicon (c-Si) solar cells was proposed in this work. The degradation rate of the solar cell performances is
Autor:
Kyotaro Nakamura, Genki Saito, Sachiko Jonai, Atsushi Masuda, Aki Tanaka, Yoshio Ohshita, Kazuo Muramatsu, Atsushi Ogura
Publikováno v:
Solar Energy. 188:1292-1297
Sodium (Na) and lithium (Li) in the silver (Ag) paste cause the potential-induced degradation (PID), while the PID of p-type crystalline silicon (Si) photovoltaic modules is caused by Na in the front cover glass. Some Ag pastes contain these elements
Autor:
Shota Asano, Ryo Hamaoka, Sachiko Jonai, Yukiko Hara, Atsushi Masuda, Norihiro Umeda, Kentaro Iwami
Publikováno v:
Japanese Journal of Applied Physics. 61:066501
In this study, we evaluated the acetic acid generation in photovoltaic (PV) modules during an accelerated reliability test that combines ultraviolet (UV) irradiation and damp-heat (DH) using tin film sensors. We employed a tin film to detect acetic a
Autor:
Yukiharu Uraoka, Yasushi Tachibana, Yasuaki Ishikawa, Kyotaro Nakamura, Atsushi Masuda, Sachiko Jonai
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
In order to investigate the role of SiNx anti-reflection coating in potential-induced degradation (PID) for p-type crystalline Si cells, PID tests were carried out using the cell without SiNx. PID did not occur with the module using the cell without
Autor:
Toshiharu Minamikawa, Sachiko Jonai, Seira Yamaguchi, Atsushi Masuda, Chizuko Yamamoto, Keisuke Ohdaira, Takeshi Toyoda, Yasushi Tachibana, Yukiko Hara
Publikováno v:
Japanese Journal of Applied Physics. 59:076503
Influences of both high-voltage stress and hygrothermal stress were studied for homojunction and heterojunction crystalline Si photovoltaic (PV) modules. In order to separately access the influence of these stresses, these PV modules were subjected t
Publikováno v:
Applied Physics Letters. 116:182107
Carrier distributions in monocrystalline silicon solar cells affected by potential-induced degradation (PID) were investigated using scanning nonlinear dielectric microscopy (SNDM), employing three samples with different PID levels. These observation
Publikováno v:
Solar Energy Materials and Solar Cells. 140:361-365
Potential-induced degradation (PID) in photovoltaic (PV) modules based on n-type single crystalline Si solar cell (front junction cell) was experimentally generated by applying negative voltage from an Al plate, which was attached on the front cover