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pro vyhledávání: '"SaÅ¡o Å turm"'
Autor:
László Péter, Kálmán Vad, Attila Csik, Rocío Muñíz, Lara Lobo, Rosario Pereiro, SaÅ¡o Å turm, Kristina Žužek Rožman, György Molnár, Katalin Németh, Katalin Neuróhr, Krisztina Boros, Lajos Pogány, Imre Bakonyi
Publikováno v:
Journal of Electrochemical Science and Engineering, Vol 8, Iss 1 (2018)
It is shown in this overview that modern composition depth profiling methods like secondary neutral mass spectroscopy (SNMS) and glow-discharge – time-of-flight mass spectrometry (GD-ToFMS) can be used to gain highly specific composition depth prof
Externí odkaz:
https://doaj.org/article/261aec54d1214e8291bea6cf8fb7eea1
