Psychiatric symptoms influence the performance on the Screener Intelligence and Learning Disabilities in general mental health care in The Netherlands

Autor: Nieuwenhuis, Jeanet, Noorthoorn, Eric, Lepping, Peter, Mulder, Niels, Nijman, Henk

Publikováno v: Advances in Mental Health and Intellectual Disabilities, 2022, Vol. 16, Issue 4, pp. 211-215.

Externí odkaz: http://www.emeraldinsight.com/doi/10.1108/AMHID-12-2021-0052

Increased prevalence of intellectual disabilities in higher-intensity mental healthcare settings

Autor: Jeanet G. Nieuwenhuis, Peter Lepping, Niels L. Mulder, Henk L. I. Nijman, Mike Veereschild, Eric O. Noorthoorn

Publikováno v: BJPsych Open, Vol 7 (2021)

Background It has been suggested that people with intellectual disabilities have a higher likelihood to develop psychiatric disorders, and that their treatment prognosis is relatively poor. Aims We aimed to establish the prevalence of intellectual d

Externí odkaz: https://doaj.org/article/6b2bff0648074119bf31e7a6dc439651

EVECCS RESEARCH GRANTS AVAILABLE FOR 2014.

Publikováno v: Journal of Veterinary Emergency & Critical Care. Jan/Feb2014, Vol. 24 Issue 1, p108-110. 3p.

Increased prevalence of intellectual disabilities in higher-intensity mental healthcare settings

Autor: Eric O. Noorthoorn, Peter Lepping, Mike Veereschild, Niels Mulder, Henk Nijman, J.G. Nieuwenhuis

Publikováno v: British Journal of Psychiatry Open, 7
BJPsych Open
British Journal of Psychiatry Open, 7, 3

BackgroundIt has been suggested that people with intellectual disabilities have a higher likelihood to develop psychiatric disorders, and that their treatment prognosis is relatively poor.AimsWe aimed to establish the prevalence of intellectual disab

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8d31db097b97b39d75371552721217af
https://hdl.handle.net/2066/234266

Submicrometer Top-Gate Self-Aligned a-IGZO TFTs by Substrate Conformal Imprint Lithography

Autor: Thijs Bel, Gerwin H. Gelinck, Laura De Kort, Roy Verbeek, Joris de Riet, Mamidala Saketh Ram, Auke Jisk Kronemeijer

Publikováno v: IEEE Transactions on Electron Devices, 4, 66, 1778-1782
IEEE Transactions on Electron Devices, 66(4):8653974, 1778-1782. Institute of Electrical and Electronics Engineers

Thin-film transistors (TFTs) are the fundamental building blocks of today’s display industry. To achieve higher drive currents and device density, it is essential to scale down the channel lengths of TFTs. To be able to fabricate short-channel TFTs

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7754e5451da48b5c3ac670e669834534
http://resolver.tudelft.nl/uuid:e4d27324-8a04-4c22-82fa-a6800137d779