Zobrazeno 1 - 3
of 3
pro vyhledávání: '"SATHYANARAYANAN KULASEKARAN"'
Autor:
GAURAV KUMAR, SAMEERA B. HAYAVADANA, LAKSHMI N. PEDAPUDI, SATHYANARAYANAN KULASEKARAN, SHASHANK S. AGASHE, SUNGHA KIM
Publikováno v:
2022 4th International Conference on Management Science and Industrial Engineering (MSIE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4056f25963e1f9bd65f390dfde74e1e0
https://doi.org/10.1145/3535782.3535829
https://doi.org/10.1145/3535782.3535829
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71a07c5f3119e09923aab24e084b7679
https://doi.org/10.1109/tsm.2023.3275588
https://doi.org/10.1109/tsm.2023.3275588
Autor:
Gaurav Sultania, Lakshmi Narayana Pedapudi, Gaurav Kumar, Shashank Shrikant Agashe, Sathyanarayanan Kulasekaran
Publikováno v:
2021 3rd International Conference on Management Science and Industrial Engineering.
A semiconductor fabrication facility (Fab) manufactures huge volume of wafers and chips. To sustain high production throughput and quality, fast and accurate Fab-In inspection and verification methods are required. These methods intake a lot of spect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f42c313303d75e88d9f81a490275a01f
https://doi.org/10.1145/3460824.3460855
https://doi.org/10.1145/3460824.3460855