Zobrazeno 1 - 8
of 8
pro vyhledávání: '"SANGHYEON BAE"'
Publikováno v:
Quantitative Finance. Nov2023, Vol. 23 Issue 11, p1597-1615. 19p.
Publikováno v:
European Journal of Operational Research. 308:321-335
A stagewise decomposition algorithm called value function gradient learning (VFGL) is proposed for large-scale multistage stochastic convex programs. VFGL finds the parameter values that best fit the gradient of the value function within a given para
Publikováno v:
Electronics; Volume 12; Issue 9; Pages: 2131
Multi-robot systems have been used in many fields by utilizing parallel working robots to perform missions by allocating tasks and cooperating. For task planning, multi-robot systems need to solve complex problems that simultaneously consider the mov
Autor:
Sunghyeon Joo, Sanghyeon Bae, Junhyeon Choi, Hyunjin Park, Sangwook Lee, Sujeong You, Taeyoung Uhm, Jiyoun Moon, Taeyong Kuc
Publikováno v:
Electronics; Volume 11; Issue 15; Pages: 2420
Advanced research in robotics has allowed robots to navigate diverse environments autonomously. However, conducting complex tasks while handling unpredictable circumstances is still challenging for robots. The robots should plan the task by understan
Autor:
Sanghyeon Bae, Jungki Ryu, Gwang-Noh Ahn, Dowon Kim, Jiseok Lee, Younghoon You, Dong-Pyo Kim, Mi-Jeong Kim, Jung-Kyun Kim, Yong-Eun Kwon
Microfluidic systems with large surface-to-volume ratios enable photocatalytic reactions to occur, avoiding the limitations of light penetration and allow the efficient transfer/mixing of mass and energy. For enhanced photocatalysis, the utilization
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9898557ff9f9e336a3d3ec6f4f2abc20
https://doi.org/10.21203/rs.3.rs-124099/v1
https://doi.org/10.21203/rs.3.rs-124099/v1
Publikováno v:
IEEE Access, Vol 9, Pp 124632-124639 (2021)
A memory fault model (FM) is an abstraction of the physical mechanism of memory failure. When the physical failure mechanisms are not fully represented in FMs, the coverage of the FMs can be different from that of the failure mechanisms. However, it
Externí odkaz:
https://doaj.org/article/54e8003aa6e74e91a31afed5f6fba598
Publikováno v:
IEEE Access, Vol 9, Pp 137514-137523 (2021)
The methodological approach of hammering multiple rows is newly proposed to evaluate today’s SDRAMs, employed with in-DRAM mitigation circuits. The multiple rows are selected based on the one-row hammering test (single row hammering without refresh
Externí odkaz:
https://doaj.org/article/c4e20534140d4565af4a40dd9d059d34
Publikováno v:
IEEE Access, Vol 9, Pp 63002-63011 (2021)
This paper shows that an intermittent AC coupling defect occurring in a DDR4 data channel will cause more intermittent errors in DDR4, compared to such defect in DDR3. The intermittent AC coupling defect occurs due to intermittent fracture in DDR4 pa
Externí odkaz:
https://doaj.org/article/0c6d5ab3ffb54b09a87739b39cee802b