Zobrazeno 1 - 10
of 20
pro vyhledávání: '"S.Z. Mumtaz"'
Publikováno v:
Journal of Quality in Maintenance Engineering. 5:128-140
Profit analysis of a two non‐identical unit cold standby system model with mutual changeover of the units is carried out in this paper. With mutual changeover of the unit, the operating unit, after functioning for some random amount of time, become
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d5e5568cc94ef3e0e3a7e5e4122f8e4
https://doi.org/10.1108/13552519910271829
https://doi.org/10.1108/13552519910271829
Publikováno v:
Microelectronics Reliability. 37:845-849
This paper investigates a two non-identical unit cold standby system model. Each unit is composed of n independent components arranged in a series configuration. A single repairman is available to repair a failed unit. The priority in operation is be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc1e61f6fd80885d4a5094cdc29920c5
https://doi.org/10.1016/s0026-2714(96)00106-0
https://doi.org/10.1016/s0026-2714(96)00106-0
Autor:
S.Z. Mumtaz, Rakesh Gupta
Publikováno v:
Journal of Quality in Maintenance Engineering. 2:66-76
Investigates a stochastic model of a two identical unit cold standby system. Assumes that, if repair of the failed unit is not completed within a specified time, then an order is placed to replace the failed unit by the new one. The specified time is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0df25c7c35a90edf9fc21f9801443ae0
https://doi.org/10.1108/13552519610130468
https://doi.org/10.1108/13552519610130468
Publikováno v:
Microelectronics Reliability. 36:517-523
This paper considers the stochastic analysis of a two-unit (original and duplicate) cold standby system model with preventive maintenance and replacement of the failed duplicate unit. The failed duplicate unit is non-repairable but its replacement is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::702649e3cf7231237b95dad6206771b6
https://doi.org/10.1016/0026-2714(95)00009-7
https://doi.org/10.1016/0026-2714(95)00009-7
Autor:
L.R. Goel, S.Z. Mumtaz
Publikováno v:
Microelectronics Reliability. 34:1279-1282
This paper considers the stochastic analysis of a two-unit (dissimilar units) cold standby system subject to revealed and unrevealed failures. We assume that a revealed failure is detected as soon as it occurs but an unrevealed failure is detected by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a1e05ea31d59a28d177fe6b7a0b8c57
https://doi.org/10.1016/0026-2714(94)90516-9
https://doi.org/10.1016/0026-2714(94)90516-9
Autor:
S.Z. Mumtaz, L.R. Goel
Publikováno v:
Microelectronics Reliability. 34:731-734
This paper studies a two (non-identical) unit cold standby system with correlated failures and repairs. The system has two types of server—regular (not perfect) and expert. The regular repairman is always available with the system while the expert
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82f8f59d730a262ff0182f9b3cc6088e
https://doi.org/10.1016/0026-2714(94)90037-x
https://doi.org/10.1016/0026-2714(94)90037-x
Publikováno v:
Microelectronics Reliability. 34:165-169
This paper deals with the analysis of an on-surface transit system with correlated failure and repair processes. Four types of failure modes—partial failure, failure type-1, failure type-2 and failure due to accident have been considered. The joint
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::716d4050aeb73bc125f520dc72ce0c7e
https://doi.org/10.1016/0026-2714(94)90487-1
https://doi.org/10.1016/0026-2714(94)90487-1
Autor:
S.Z. Mumtaz, L.R. Goel
Publikováno v:
Microelectronics Reliability. 33:1107-1111
This paper deals with the analysis of a homogeneous Markov model for phased-mission reliability characteristics. A possible interpretation for the system is that of a satellite containing two computer units. The satellite is launched in phase 1, depl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b9dd883191ce6af7208a2d1b8fbc572
https://doi.org/10.1016/0026-2714(93)90339-z
https://doi.org/10.1016/0026-2714(93)90339-z
Autor:
L.R. Goel, S.Z. Mumtaz
Publikováno v:
Microelectronics Reliability. 33:297-301
This paper considers a single unit (hence forth we call it a main unit) system with a helping unit. Initially both units are operative. The functioning of the main unit is assumed to be dependent on the helping unit, if the helping unit is in the ope
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32508e2306eaf5e7ef82efd9fd12bd63
https://doi.org/10.1016/0026-2714(93)90015-q
https://doi.org/10.1016/0026-2714(93)90015-q
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.