Zobrazeno 1 - 10
of 20
pro vyhledávání: '"S.T. Zachariah"'
Autor:
S.T. Zachariah, S. Chakravarty
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 23:433-439
Enumeration and prioritization of highly probable bridges based on the circuit layout and manufacturing defect data is a key step in defect-based testing. Existing solutions either do not scale to large designs or compromise on the accuracy of the co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d889534d082843d904eb7f912ba7bf5a
https://doi.org/10.1109/tcad.2004.823351
https://doi.org/10.1109/tcad.2004.823351
Autor:
S.T. Zachariah, S. Chakravarty
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 11:741-744
Current bridge fault extraction techniques are limited by performance and capacity constraints. In this paper, we present a fast and accurate algorithm to extract and rank two-node bridges based on the computation of their weighted critical area. Exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99078b2fb9ccc7401388b43bd8365ff8
https://doi.org/10.1109/tvlsi.2003.816141
https://doi.org/10.1109/tvlsi.2003.816141
Autor:
S.T. Zachariah, S. Chakravarty
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 19:568-576
State-transition-based method (STBM), a fast algorithm for computing leakage fault coverage of I/sub DDQ/ tests and selecting optimal I/sub DDQ/ measurement points, targeting leakage faults, is presented. Experimental results presented show that STBM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0bd64e4a004034da0baa46ee4fcd03b3
https://doi.org/10.1109/43.845081
https://doi.org/10.1109/43.845081
Autor:
S. Kunduc, S.T. Zachariah, Debasis Mitra, Susmita Sur-Kolay, Subhasis Bhattacharjee, Bhargab B. Bhattacharya
Publikováno v:
VLSI Design
In deep sub-micron VLSI chips, when several transistors in physical proximity switch simultaneously, a substantial power supply drop, known as droop, may occur because of concurrent load on a via of the power grid. As a result of lower supply voltage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dc64849ee7e9864ab1c816d4f2f4d8f
https://doi.org/10.1109/vlsid.2006.158
https://doi.org/10.1109/vlsid.2006.158
Publikováno v:
ITC
An impressive body of theoretical research to model the behavior of bridges exists. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volum
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a186d62f434c663f13d6c1d07e81b65f
https://doi.org/10.1109/test.2002.1041801
https://doi.org/10.1109/test.2002.1041801
Publikováno v:
VTS
Previously published work has pointed out that open defects are escaping test screens. To plug this hole, tests directed at nets susceptible to opens are required, and, therefore, nets susceptible to opens need to be identified. Opens caused by rando
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d17ff437a2c02dc2bdc5789f03e3eeb
https://doi.org/10.1109/vts.2002.1011166
https://doi.org/10.1109/vts.2002.1011166
Publikováno v:
Digest of Papers IEEE International Workshop on IDDQ Testing.
An efficient algorithm, named state transition based method (STEM), for simulating I/sub DDQ/ tests for leakage faults is presented. It also provides an efficient framework for "incremental fault simulation" which is embedded in the problem of select
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e1f94d87de9989ec685661abd996322
https://doi.org/10.1109/iddq.1997.633014
https://doi.org/10.1109/iddq.1997.633014
Autor:
S.T. Zachariah, S. Chakravarty
Publikováno v:
VLSI Design
Defects that short two or more modes are known as multinode bridges. Multinode bridge analysis can be used to extract a list of either only two-node bridges or multi-node bridges. We discuss why multi-node bridge analysis is also required even if onl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::257c3ed8dc5a0d03f560a0fe78b4ecd6
https://doi.org/10.1109/icvd.2001.902681
https://doi.org/10.1109/icvd.2001.902681
Autor:
S.T. Zachariah, S. Chakravarty
Publikováno v:
ITC
Enumeration and prioritization of highly probable bridges based on the circuit layout and manufacturing defect data is a key step in defect based testing. Existing solutions either do not scale to large designs or compromise on the accuracy of the co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a2bffcbcbc6b4354dd51cd172eb9d29
https://doi.org/10.1109/test.2000.894271
https://doi.org/10.1109/test.2000.894271
Autor:
S. Chakravarty, S.T. Zachariah
Publikováno v:
VLSI Design
Pseudo stuck-at is a popular model, used by many commercial tool vendors, for evaluating and selecting I/sub DDQ/ tests. We show that pseudo stuck-at fault coverage numbers are very pessimistic, and equally good vectors can be selected much faster us
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7237c5e40d3b28893ab8fbfbc56df751
https://doi.org/10.1109/icvd.1999.745130
https://doi.org/10.1109/icvd.1999.745130