Zobrazeno 1 - 10
of 27
pro vyhledávání: '"S.S. Ghots"'
Autor:
R. Z. Bakhtizin, S.S. Ghots
Publikováno v:
Applied Surface Science. 215:105-112
A new model of low-frequency fluctuations, based on the thermionic current model [Mathematical Handbook for Scientists and Engineers, New York, 1961; Introduction to Statistical Radio-Physic. Part 1: Random Processes, Moscow, 1976 (in Russian)], has
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0b278b4a3d55aeab6e7e8ec74c46d6c
https://doi.org/10.1016/s0169-4332(03)00314-3
https://doi.org/10.1016/s0169-4332(03)00314-3
Publikováno v:
Journal of Micromechanics and Microengineering. 3:45-48
The statistical characteristics of low-frequency field emission current fluctuations contain information about the microscopic properties of solid surfaces. For p-type Ge with an atomically clean surface the distribution functions of the field emissi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87a0a5e9ca5e8aa5800f4b0bff2f4c74
https://doi.org/10.1088/0960-1317/3/2/002
https://doi.org/10.1088/0960-1317/3/2/002
Autor:
S.S. Ghots, R.Z. Bakhtizin
Publikováno v:
Surface Science. 266:121-125
The spectral characteristics of the low frequency current fluctuations of p-type Ge field emitters have been investigated. To describe the power noise spectra a statistical model as well as the appropriate semi-empirical formula have been proposed. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7801a03bc1f7ba171b6c9b342e23f89
https://doi.org/10.1016/0039-6028(92)91007-x
https://doi.org/10.1016/0039-6028(92)91007-x
Autor:
S.S. Ghots, R.Z. Bakhtizin
Publikováno v:
Surface Science. 246:60-63
The effect of ion bombardment at 1.2–3.0 keV on the field emission noise spectra from GaAs was measured in the 0.02–10.0 Hz frequency range. The data obtained were used to calculate the effective interaction cross-section between the ions of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c42b62cea943b5ae384c93aab6ca0294
https://doi.org/10.1016/0039-6028(91)90393-7
https://doi.org/10.1016/0039-6028(91)90393-7
Low-freouency Fluctuation Characteristics And Current Stability Of Thin Film Field Emission Cathodes
Publikováno v:
[Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ffc41662d36fcbe0d59275ab2815680
https://doi.org/10.1109/ivmc.1993.700253
https://doi.org/10.1109/ivmc.1993.700253
Publikováno v:
IEEE Transactions on Electron Devices. 38:2398-2400
The authors report on technological peculiarities of fabrication of large-area gallium arsenide multipoint cathodes. The topics discussed are fabrication methods, noise characteristics and uniformity of emission, and lifetime and degradation of semic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::442664203a130009c194f7229a8e5a89
https://doi.org/10.1109/16.88534
https://doi.org/10.1109/16.88534
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Publikováno v:
Surface Science Letters. 247:A213
For p-type GaAs, the spectral density and distribution functions of field emission current fluctuations have been measured from local surface area of the size of 10−12 cm2 in the 0.01–1000 Hz frequency range. It was found that the distribution fu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::509648abb7577564016bf18e1411098c
https://doi.org/10.1016/0167-2584(90)90111-j
https://doi.org/10.1016/0167-2584(90)90111-j
Publikováno v:
Le Journal de Physique Colloques. 48:C6-203
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdf3ae01086b5f15ff0d6a8941ac64e8
https://doi.org/10.1051/jphyscol:1987633
https://doi.org/10.1051/jphyscol:1987633
Publikováno v:
Le Journal de Physique Colloques. 49:C6-495
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::488ed341061cd826260832118732a96d
https://doi.org/10.1051/jphyscol:1988684
https://doi.org/10.1051/jphyscol:1988684