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pro vyhledávání: '"S.P. Buchner"'
Akademický článek
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Publikováno v:
IEEE Transactions on Nuclear Science. 57:1805-1810
Pulsed laser light has been used to reveal how total ionizing dose radiation affects the propagation of single event transients in a string of inverters. By holding the input to the string of inverters at high voltage (1.8 V) during exposure to ioniz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65aa467734ddcbb582aedcd168b37675
https://doi.org/10.1109/tns.2010.2046752
https://doi.org/10.1109/tns.2010.2046752
Autor:
Dakai Chen, Anthony M. Phan, Andrew L. Sternberg, Hak Kim, Ken LaBel, S.P. Buchner, Dale McMorrow
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3138-3144
We present results of laser-induced analog SETs at elevated temperatures. We found increasing pulse widths with increasing temperature for the LM124. We also observed increasing pulse amplitudes with increasing temperature for several sensitive trans
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d556c16e727a313653ff0d6a5818acf
https://doi.org/10.1109/tns.2009.2032763
https://doi.org/10.1109/tns.2009.2032763
Autor:
R. Marec, Eric Lorfevre, Vincent Pouget, P. Calvel, B. Azais, Jerome Boch, S.P. Buchner, Nicolas J.-H. Roche, Jean-Roch Vaillé, Laurent Dusseau, Y G Velo, G. Auriel, J.-P. David, Frédéric Saigné
Publikováno v:
7th European Workshop on Radiation and its Effects on Components and Systems
7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2009, 56 (4), pp.1971-1977. ⟨10.1109/TNS.2009.2015313⟩
7th European Workshop on Radiation and its Effects on Components and Systems, 2008, Jyvaskyla, Finland
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2009, 56 (4), pp.1971-1977. ⟨10.1109/TNS.2009.2015313⟩
An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39caec65e7f124f3c7d69b5f82606a70
https://doi.org/10.1109/tns.2009.2015313
https://doi.org/10.1109/tns.2009.2015313
Autor:
Tom Hait, E. Buchanan, K. Ray, T.R. Oldham, Harvey Moseley, S.P. Buchner, S. E. Meyer, M. Pearce, J. G. Tuttle, D. Bloom, A. Beamer, E. Quinn, D.A. Rapchun
Publikováno v:
IEEE Transactions on Nuclear Science. 54:2463-2467
Total ionizing dose (TID) measurements at low temperature (60 K) of a micro-electro-mechanical system (MEMS) microshutter array (MSA) indicate that exposing the MSA to ionizing radiation causes some of the shutters to stop operating properly. The num
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::918a5620a30bb3fd9437feb3f1621dac
https://doi.org/10.1109/tns.2007.910040
https://doi.org/10.1109/tns.2007.910040
Autor:
R. Katz, Dale McMorrow, M.C. Maher, Martha V. O'Bryan, F.W. Sexton, Raymond L. Ladbury, Ken LaBel, B. Bartholet, S.P. Buchner, C. Poivey, M. Baze
Publikováno v:
IEEE Transactions on Nuclear Science. 53:1819-1824
This paper describes application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7cfee0dcb548be29a30ddf3a5a64b737
https://doi.org/10.1109/tns.2006.880929
https://doi.org/10.1109/tns.2006.880929
Akademický článek
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Autor:
R. L. Pease, Lloyd W. Massengill, Ronald D. Schrimpf, A.L. Sternberg, S.P. Buchner, Hugh J. Barnaby, Y. Boulghassoul, J.W. Howard
Publikováno v:
IEEE Transactions on Nuclear Science. 49:1496-1501
Laser data and simulation tools are combined to investigate the single-event transient response of the LM124 operational amplifier. The effect of the bandwidth and gain on transients originating in different stages in the operational amplifier is stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8657f5d8a8c0c2b7f6b6c62bf6bb6a5d
https://doi.org/10.1109/tns.2002.1039690
https://doi.org/10.1109/tns.2002.1039690
Autor:
Megan C. Casey, Dakai Chen, Kenneth A. LaBel, Daniel P. Violette, Donna J. Cochran, Raymond L. Ladbury, Alvin J. Boutte, S.P. Buchner, Martha V. O'Bryan, Michael J. Campola, Robert A. Gigliuto, Alyson D. Topper, Melanie D. Berg, Jean-Marie Lauenstein, Jonathan A. Pellish, Edward P. Wilcox
Publikováno v:
2014 IEEE Radiation Effects Data Workshop (REDW).
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects (SEE), proton-induced displacement damage (DD), and total ionizing dose (TID)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0de72d295c9864594d454428bbe4828a
https://doi.org/10.1109/redw.2014.7004560
https://doi.org/10.1109/redw.2014.7004560
Akademický článek
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