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Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 269:2063-2066
The electronic energy loss of hydrogen ions in KCl was investigated in a wide energy range. Thin films of KCl were evaporated on an Au/Si substrate. Rutherford Backscattering Spectrometry (RBS) was performed with protons and deuterons at energies fro
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 269:1171-1174
Charge exchange of 4 He + and 3 He + ions with surfaces of polycrystalline aluminium and Al(1 1 1) was investigated in the low-energy ion scattering (LEIS) regime. Ion spectra were recorded for primary energies ranging from 280 to 4000 eV by using an
Autor:
Daniel Primetzhofer, Miroslav Kolíbal, Tomáš Matlocha, Petr Bábor, S.N. Markin, Tomáš Šikola, Stanislav Průša, Peter Bauer
Publikováno v:
Surface Science. 604:1906-1911
A classical dynamics simulation of the low energy He+ ion scattering on a Cu(100) surface was carried out for a more detailed explanation of LEIS azimuthal scans with respect to a previous work. The Thomas-Fermi–Moliere screened potential was used
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v.267, 624-627 (2009)
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Different single and polycrystalline surfaces of Cu and Ag have been investigated by time-of-flight low-energy ion scattering using 4 He + ions. The fraction of ions that survived single scattering from the outermost surface layers, P + , was measure
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 267:634-637
The ion fraction analysis of 4He+ ions backscattered from various faces of copper single crystals is performed by using time-of-flight (TOF) and electrostatic analyzer (ESA) low-energy ion scattering (LEIS) techniques. When an experiment that integra
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 267:638-641
Angular scans were performed for a Cu(1 0 0) single crystal and 3 keV He + ions. The results were compared to simulations using the Monte-Carlo code TRIC [R. Andrzejewski, Ph.D. thesis, Universidad Autonoma de Madrid, 2008; V.A. Khodyrev, R. Andrzeje
Autor:
O. Tomanec, Tomáš Šikola, L. Dittrichova, J. Spousta, Miroslav Kolíbal, Peter Bauer, S.N. Markin, M. Plojhar, Stanislav Průša
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 265:569-575
Low energy ion scattering (LEIS) is used to characterize Ga layers deposited onto Si(1 1 1)-(7 × 7) substrates at different deposition temperatures. The Ga/Si system exhibits a pronounced 3D island growth and thus is a suitable object to investigate
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 258:32-35
By use of the TRBS code, Monte-Carlo simulations are performed for He projectiles in the energy range 1–100 keV and thin (2 nm) and thick Cu layers as targets. The influence of the scattering potential and of the electronic stopping force was inves