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Publikováno v:
Vacuum. 118:55-58
In this study, the Ge/NiGe (3 nm/16 nm) bilayer was deposited by sputtering at room temperature to serve as the recording film for write-once blu-ray disc. The thermal properties, optical characteristics, crystallization mechanisms and recording perf
Publikováno v:
IEEE Transactions on Magnetics. 50:1-4
In this paper, Ni 41 Ge 59 , Ni 46 Ge 54 , Ni 50 Ge 50 , Ni 58 Ge 42 thin films with the thickness of 16 nm were deposited at room temperature by cosputtering using Ni and Ge targets. From the result of reflectivity-temperature measurement, it was fo
Publikováno v:
IEEE Transactions on Magnetics. 50:1-4
The In 10 Ge x Sb 52-x Sn 23 Te 15 films (x = 2, 5, 7, and 9) were grown on silicon wafers, glass, and polycarbonate substrates at room temperature by dc magnetron sputtering. The thickness of In 10 Ge x Sb 52-x Sn 23 Te 15 films is fixed at 20 nm. T
Publikováno v:
Surface and Coatings Technology. 219:139-143
Al-doped ZnO (AZO) and Ag–Ti films were successfully deposited on glass substrates by multi-target magnetron sputtering to form the high transparent AZO/Ag–Ti/AZO multilayer. The optical, electrical properties and lifetime performance were invest
Publikováno v:
Journal of Nanoscience and Nanotechnology. 11:11171-11175
CoPt/Ag films were prepared by magnetron sputtering on glass substrates and subsequent annealing. The dependence of degree of ordering and magnetic properties on Ag film thickness and annealing conditions were investigated. It was found that the Ag u
Publikováno v:
Thin Solid Films. 519:5199-5202
A Co 3 Pt magnetic layer with a thickness of 7–28 nm was deposited onto a Pt underlayer. As-deposited Co 3 Pt/Pt double-layered films with or without a 5 nm Pt capping layer were annealed at temperatures between 275 and 375 °C. The results show th
Thickness dependence of microstructures and magnetic properties for CoPt/Ag nanocomposite thin films
Publikováno v:
Thin Solid Films. 518:7356-7359
Ag underlayer (30 nm) has improved the degree of ordering and perpendicular magnetic anisotropy of CoPt films (7.5–10 nm). After annealing at 600 °C and 700 °C, the perpendicular coercivity of CoPt/Ag films has been raised as the thicknesses of C
Publikováno v:
Advanced Materials Research. :723-726
Fe100-xPtx single-layered films with Pt contents (x) = 32~69 at.% were deposited on natural-oxidized Si(100) substrate by dc magnetron sputtering. Then the films were post-annealed at 700 °C for 3 min by a rapid thermal annealing (RTA) with a high h
Publikováno v:
Advanced Materials Research. :655-658
The microstructures and magnetic properties of CoPt thin films with thicknesses between 1 and 20 nm deposited on amorphous glass substrate and post-annealing at 600°C for 30 min were investigated. The morphology of CoPt thin film would change from a