Zobrazeno 1 - 10
of 52
pro vyhledávání: '"S.L. Chryssoulis"'
Autor:
S. Acar, M.D. Adams, N. Ahern, A.U. Akcil, C. Aldrich, J.E. Angove, E. Asselin, M.G. Aylmore, J.Y. Baron, P. Bateman, G. Beale, M.M. Botz, P. Breuer, N. Briggs, A.R.G. Brown, A. Charitos, Y. Choi, S.L. Chryssoulis, A.P. Cole, M. Costello, F.K. Crundwell, G. Deschênes, X. Díaz, D. Donato, D.B. Dreisinger, R. Dunne, S. Ellis, C.J. Ferron, S. Flatman, C.A. Fleming, M. Fullam, A. Götz, S. Gray, B. Green, N. Greenwald, Y. Gu, J. Güntner, F. Habashi, J. Hammerschmidt, R.J. Holmes, D.G. Hulbert, M. Jeffrey, E. Johanson, J. Johnson, D.W. Kappes, B. Kerstiens, M. Kotze, G. Kyriakakis, H. Lacy, G. Lane, G.T. Lapidus, A. Laplante, D. Lunt, J. Mackenzie, T.J. Manning, M.L. McCaslin, J. McMullen, P. Messenger, M. Millard, J.D. Miller, P. Miller, J. Mitchell, M.B. Mooiman, J.B. Mosher, T.I. Mudder, A. Muir, J. Muller, N.D. Overdevest, M.S. Pearson, M. Reuter, D. Rogers, P. Rohner, A. Ryan, C. Sabbagha, B. Sceresini, R. Shaw, L. Simpson, H. Smith, W.P. Staunton, D. Stephenson, K.G. Thomas, A. van Schaik, M. Virnig, R. Walton, R.-Y. Wan, J. Wates, B. Watson, T. Weeks, D. Williams, J. Zhou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c64709c0219147dd11bc923bf3a43aee
https://doi.org/10.1016/b978-0-444-63658-4.01002-1
https://doi.org/10.1016/b978-0-444-63658-4.01002-1
Autor:
S.L. Chryssoulis, S. S. Dimov
Publikováno v:
Applied Surface Science. :265-268
This work describes a comprehensive characterization of the factors controlling the floatability of free gold from flotation test using reagents (collectors) at plant concentration levels. A relationship between the collectors loadings on gold partic
Autor:
S. S. Dimov, S.L. Chryssoulis
Publikováno v:
Applied Surface Science. :528-532
Results from a comparative study on the detection of organic collectors by TOF-SIMS, vacuum ultraviolet surface analysis by laser ionization with TOF-SIMS detection (VUV SALI TOF-SIMS) and VUV SALI with laser desorption (VUV TOF-LIMS) are reported. T
Publikováno v:
Analytical Chemistry. 75:6723-6727
Results are presented for the trace analysis of Pd and Rh by time-of-flight-resonance ionization mass spectrometry (TOF-RIMS). The spectrometer, developed at the Advanced Mineral Technology Laboratory (Ontario, Canada), is based on a commercial laser
Publikováno v:
Applied Surface Science. :644-647
To the best of our knowledge, this is the first attempt ever to speciate gold preg-robbed by carbonaceous matter using a surface sensitive microbeam technique. This approach enables the direct determination of gold species sorbed on carbonaceous part
Publikováno v:
Review of Scientific Instruments. 73:4295-4306
An instrument for time-of-flight resonance ionization mass spectrometry (TOF-RIMS) developed at the Advanced Mineral Technology Laboratory (Ontario, Canada) is described which has been applied to the quantitative trace analysis of metals in minerals.
Autor:
S.L. Chryssoulis, S.S. Dimov
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 53:399-406
The standardization of the time-of-flight laser ionization mass spectrometry (TOF-LIMS) analysis of mineral surfaces is an important step towards providing reproducible quantitative data. This paper reports the search for experimental conditions and
Publikováno v:
International Journal of Mineral Processing. 51:27-37
Recently, pre-activation was determined to be an important reason for selectivity problems in the processing of a Boliden sulphide ore. The Petiknas South ore was investigated by TOF-LIMS (time of flight laser ionisation mass spectrometry) and it is
Publikováno v:
Minerals Engineering. 8:421-430
Time-of-flight secondary ion mass spectromeetry (TOF-SIMS) was used to characterize the surface composition of mineral particles from concentrator and laboratory test samples. The surface composition of mineral particles ranging in size from 20–100
Autor:
S.L. Chryssoulis, S.S. Dimov
Publikováno v:
Applied Surface Science. :235-237
The TOF-RIMS mass spectrometer developed at AMTEL has been successfully applied for quantitative trace element analysis of Au, Pd and Rh in sulphides, iron oxides and silicates. Quantification of the TOF-RIMS measurements is performed on the basis of