Zobrazeno 1 - 10
of 52
pro vyhledávání: '"S.I. Frolov"'
Publikováno v:
Надежность и качество сложных систем, Iss 3 (2024)
Background. The aim of the work is to develop an engineering methodology for calculating printed circuit board assemblies with a rigid substrate. The analysis of methods and techniques for calculating resonance-free (in the operating frequency rang
Externí odkaz:
https://doaj.org/article/12b81b8d1ad844d88de48de114575c9c
Publikováno v:
Надежность и качество сложных систем, Iss 2 (2022)
Background. The basis of the load-bearing structures of on-board electronic systems (OES), as well as many other engineering products, are thin-walled elements – rods, plates, shells, which should provide the necessary strength, stability and rig
Externí odkaz:
https://doaj.org/article/3c34c448a52f45089308eb0886a7f655
Autor:
S.I. Frolov, V.S. Ivanov
Publikováno v:
Пожаровзрывобезопасность. 19:14-19
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a093ff289bdfc6ae402956270a3ed4e5
https://doi.org/10.18322/pvb.2010.19.01.14-19
https://doi.org/10.18322/pvb.2010.19.01.14-19
Autor:
Walter Fussel, V. G. Litovchenko, S.I. Frolov, Vladimir B. Lozinskii, Elena G. Schmidt, I. P. Lisovskii, Hans Flietner
Publikováno v:
Journal of Non-Crystalline Solids. 187:91-95
The structure of vitreous SiO2 and SiOx films has been studied using IR-spectroscopy, gravimetry and computer modeling. Deconvolution of the silicon-oxygen stretching band into Gaussian profiles is carried out, the main parameters of elementary vibra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::122ee04597330a96dc74dce4a85e6bd1
https://doi.org/10.1016/0022-3093(95)00118-2
https://doi.org/10.1016/0022-3093(95)00118-2
Publikováno v:
Thin Solid Films. 247:264-270
The structure of thin (7–809 nm) SiO 2 films subjected to a bombardment of 40 Ar ions of 2.7 keV is studied using infrared spectroscopy with computer analysis of the spectral shape, multiple-angle spectral ellipsometry and Auger spectroscopy. The f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58683228c95eac9d86682f45376b3c0b
https://doi.org/10.1016/0040-6090(94)90811-7
https://doi.org/10.1016/0040-6090(94)90811-7
Publikováno v:
Thin Solid Films. 238:119-122
The effect of plasma treatment and subsequent oxygen annealing on the critical temperature of superconducting transition T c and optical properties of high- T c superconducting GdBa 2 Cu 3 O 7− x films was studied. The optimal treatment conditions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dca73ded539e52a97ec85225bc2b1033
https://doi.org/10.1016/0040-6090(94)90660-2
https://doi.org/10.1016/0040-6090(94)90660-2
Publikováno v:
Physica B: Condensed Matter. 185:394-399
The electroreflectance spectra of cubic silicon carbide crystals are measured in the range 1.0 to 5.6 eV. The energies of direct optical transitions are determined using a multiple oscillator model. The electronic band structure and optical functions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01d3f194f356e2206217a114383dab41
https://doi.org/10.1016/0921-4526(93)90267-a
https://doi.org/10.1016/0921-4526(93)90267-a
Publikováno v:
Thin Solid Films. 190:255-263
A model of the electronic structure of graphite-like carbon films, describing the semiconductor properties of this material, is presented. Spectra of optical constants of microcrystalline carbon films in the region λ = 0.4–8.0 μm were studied by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::477b2a3564ebd920bd17e854673877f5
https://doi.org/10.1016/0040-6090(89)90915-2
https://doi.org/10.1016/0040-6090(89)90915-2
Publikováno v:
Thin Solid Films. 207:270-272
High temperature superconducting films of GdBa2Cu3O7−x have been studied by spectral ellipsometry and X-ray spectroscopy. Spectra of the imaginary part of the dielectric permittivity function, ϵ2, have been obtained in the range from 1.5 to 4.5 eV
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e682c992d561241da319c296c9134eab
https://doi.org/10.1016/0040-6090(92)90136-y
https://doi.org/10.1016/0040-6090(92)90136-y
Autor:
B. N. Shkarban, Dietmar Krueger, S.I. Frolov, Nickolai I. Klyui, V. A. Mitus, V. G. Litovchenko
Publikováno v:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.
In the framework of virtual crystal approximation using the empiricalpseudopotential theory optical transitions of SiiGe have been calculated. The effects of hydrostatic and uniaxial stress, and alloy stoichiometry on the optical gaps were investigat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2279bf0687d4370d5ce002ea13187465
https://doi.org/10.1117/12.226206
https://doi.org/10.1117/12.226206