Zobrazeno 1 - 10
of 32
pro vyhledávání: '"S.H. Moffat"'
Autor:
André Perrin, Maryline Guilloux-Viry, S.H. Moffat, N. Bontemps, Yves Guldner, J.P. Vieren, S. Djordjevic, John S. Preston, Xavier Castel, L. A. de Vaulchier
Publikováno v:
The European Physical Journal B. 5:847-858
Measurement of the penetration depth λ(T) as a function of temperature using millimeter wave transmission in the range 130-500GHz are reported for three YBa2 (YBCO) laser ablated thin films. Two films, deposited on a LaAlO3 substrate (Tc=90.2 K), ex
Publikováno v:
Il Nuovo Cimento D. 20:563-572
We have deduced the penetration depth λ(T) on YBa2Cu3O7 thin films from transmission measurement in the range 100–550 GHz. Our data yield simultaneously the absolute value and the temperature dependence of λ(T). In lower-quality films, we report
Publikováno v:
Physical Review B. 55:R14741-R14744
Light ion irradiation is used to gain insight into nonlinear transport in the absence of an applied magnetic field. Detailed measurements of the electric-field{endash}current-density characteristics of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} microb
Autor:
Robert A. Hughes, M. Lindgren, C. Williams, Roman Sobolewski, John S. Preston, Marc Currie, Thomas Y. Hsiang, S.H. Moffat, Frank A. Hegmann, Philippe M. Fauchet
Publikováno v:
IEEE Transactions on Appiled Superconductivity. 7:3422-3425
Using a subpicosecond electro-optic sampling technique, we have characterized the photoresponse of current-biased YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) photodetectors, designed as 5-/spl mu/m-wide and 7-/spl mu/m-long microbridges patterned in 100-nm-
Autor:
Robert A. Hughes, T. Strach, G.D. Poulin, Dimitri Basov, John S. Preston, Thomas Timusk, S.H. Moffat
Publikováno v:
IEEE Transactions on Appiled Superconductivity. 7:2005-2008
Point defects have been introduced into YBa/sub 2/Cu/sub 3/O/sub 7/ through low energy helium ion irradiation in order to probe the origin of dissipation in a current-carrying superconductor. Resistivity, infrared reflectance and x-ray diffraction me
Autor:
A. N. Terentiev, J. van Lierop, J.P. Harrison, S.H. Moffat, John S. Preston, Robert A. Hughes
Publikováno v:
Cryogenics. 37:113-116
The yttrium barium copper oxide (YBCO) high- T c superconductor has a sharp dissipation peak at the magnetic flux phase transformation temperature, whether in the form of a single crystal, ceramic, or thin film. This peak has been proposed as the bas
Autor:
John S. Preston, Frank A. Hegmann, Robert A. Hughes, Marc Currie, S.H. Moffat, Roman Sobolewski, P. M. Fauchet, T.Y. Hsiang, M. Lindgren, C. Williams
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 2:668-678
We report our femtosecond time-resolved measurements of the photoresponse of microbridges in YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) thin films, performed using an electrooptic sampling technique. Our test structures consisted of 5-/spl mu/m-wide, 7-/sp
Autor:
Marc Currie, John S. Preston, Roman Sobolewski, S.H. Moffat, C. Williams, Robert A. Hughes, T. Y. Hsiang, M. Lindgren, Philippe M. Fauchet, Frank A. Hegmann
Publikováno v:
Applied Physics Letters. 74:853-855
We report our femtosecond time-resolved measurements on the photoresponse of an epitaxial YBa2Cu3O7−x (YBCO) thin-film photodetector, patterned into a microbridge geometry. By varying the current–voltage biasing conditions between the superconduc
Autor:
Wen-Sheng Zeng, John S. Preston, Roman Sobolewski, Robert A. Hughes, C. Williams, T. Y. Hsiang, M. Lindgren, Frank A. Hegmann, S.H. Moffat, Philippe M. Fauchet, Marc Currie
Publikováno v:
CLEO '97., Summaries of Papers Presented at the Conference on Lasers and Electro-Optics.
Autor:
Robert A. Hughes, C.‐C. Wang, P. M. Fauchet, T. Y. Hsiang, D. Jacobs-Perkins, Frank A. Hegmann, John S. Preston, Roman Sobolewski, Marc Currie, S.H. Moffat
Publikováno v:
Applied Physics Letters. 67:285-287
Photoresponse signals with widths as short as 1.5 ps are observed from epitaxial YBa2Cu3O7−δ thin films using electro‐optic sampling techniques. Voltage transients less than 2 ps wide are seen in 100‐ and 200‐nm films exposed to 150‐fs las