Zobrazeno 1 - 10
of 64
pro vyhledávání: '"S.B. Ippolito"'
Autor:
S.B. Ippolito, M. Selim Ünlü, A. Nickolas Vamivakas, Anna K. Swan, R.D. Younger, Ernest R. Behringer, Bennett B. Goldberg
Publikováno v:
American Journal of Physics. 76:758-768
Microscopes are natural objects of study in introductory and upper level courses that cover optics because they are used in most science and engineering disciplines. The solid immersion microscope has been developed to study a variety of physical sys
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2368f52657da4ab3b3761a0f3ce87b19
https://doi.org/10.1119/1.2908186
https://doi.org/10.1119/1.2908186
Autor:
Anna K. Swan, M.S. Unlu, Charles R. Cantor, Bennett B. Goldberg, L. Moiseev, Brynmor J. Davis, S.B. Ippolito, William Clement Karl
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 9:294-300
We introduce a new fluorescence microscopy technique that maps the axial position of a fluorophore with subnanometer precision. The interference of the emission of fluorophores in proximity to a reflecting surface results in fringes in the fluorescen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5efd0d0c1d1ec4de644baf140a0c74f6
https://doi.org/10.1109/jstqe.2003.814191
https://doi.org/10.1109/jstqe.2003.814191
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 8:1051-1059
We describe recent experimental and theoretical advances in immersion lens microscopy for, both surface and subsurface imaging as applied to photonic nanostructures. We examine in detail the ability of sharp metal tips to enhance local optical fields
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7777abee930b6d4d8a1c4518b6dd30b
https://doi.org/10.1109/jstqe.2002.804232
https://doi.org/10.1109/jstqe.2002.804232
Autor:
John Sylvestri, Larry Fischer, Sweta Pendyala, Scott Dinkel, T. Kane, S.B. Ippolito, Rich Oldrey, Manuel Villalobos, Bruce J. Redder, Michael P. Tenney, Pat McGinnis, Darrell L. Miles
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper describes novel concepts in equipment and measurement techniques that integrate optical electrical microscopy and scanning probe microscopy (SPM) capabilities into a single tool under the umbrella of optical nanoprobe electrical (ONE) micr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7d99ae7facc8c5b65889803e1b0bd886
https://doi.org/10.31399/asm.cp.istfa2013p0208
https://doi.org/10.31399/asm.cp.istfa2013p0208
Publikováno v:
Applied Physics Letters. 78:4071-4073
We present a high-spatial-resolution subsurface microscopy technique that significantly increases the numerical aperture of a microscope without introducing an additional spherical aberration. Consequently, the diffraction-limited spatial resolution
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79f69d56921ebb5de2b3914f81f80dde
https://doi.org/10.1063/1.1381574
https://doi.org/10.1063/1.1381574
Autor:
Hirotoshi Terada, S.B. Ippolito
Publikováno v:
International Symposium for Testing and Failure Analysis.
Tailoring the angular spectrum with annular illumination and collection can significantly improve integrated circuit analysis with an optical microscope, when combined with solid immersion. We present the development, testing, and optimization of a s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::144f69f0228ca306b8123be55cb2c2a3
https://doi.org/10.31399/asm.cp.istfa2009p0060
https://doi.org/10.31399/asm.cp.istfa2009p0060
Publikováno v:
Optics letters. 34(8)
We investigate the effect of an annular pupil-plane aperture in confocal imaging while using an NA increasing lens. We show that focal spot shape is highly sensitive to both polarization and angular spectrum of the incoming light. We demonstrate a la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a06eb846f46fabbd14ad25ed0ba5b892
https://pubmed.ncbi.nlm.nih.gov/19370137
https://pubmed.ncbi.nlm.nih.gov/19370137
Publikováno v:
SPIE Proceedings.
We present a technique that involves tailoring the angular spectrum in optical microscopy of silicon integrated circuits, with a solid immersion lens. Spatial light modulation to select only supercritical light at the substrate/dielectric interface,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::662735072bc344885bf9b60363d91fcf
https://doi.org/10.1117/12.806545
https://doi.org/10.1117/12.806545
Autor:
Pat McGinnis, A. W. Kozaczka, Zhigang Song, T. Kane, A. Shore, B. Paulucci, Michael P. Tenney, F. G. Trudeau, S.B. Ippolito
Publikováno v:
International Symposium for Testing and Failure Analysis.
It is generally accepted that the fault isolation of Vdd short and leakage can be globally addressed by liquid crystal analysis (LCA), photoemission analysis and/or laser stimulating techniques such as OBIRCH or TIVA. However, the hot spot detected b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8970eb98238bcaf0997e7b27ce3f7257
https://doi.org/10.31399/asm.cp.istfa2008p0075
https://doi.org/10.31399/asm.cp.istfa2008p0075
Publikováno v:
LEOS 2008 - 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society.
We demonstrate a lateral spatial resolution of 160 nm (lambda0/8) using apodization in subsurface backside microscopy of silicon integrated circuits - a record resolution for one-photon excitation schemes.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8572b04a356b9db4fed4b1fdd4b21e4
https://doi.org/10.1109/leos.2008.4688631
https://doi.org/10.1109/leos.2008.4688631