Zobrazeno 1 - 10
of 1 149
pro vyhledávání: '"S. Zennaro"'
Autor:
Javed, Iqra1,2 (AUTHOR) iqra.javed@umt.edu.pk, Nukman, Yusoff1 (AUTHOR), Ghazilla, Raja Ariffin bin Raja1 (AUTHOR), Ahmad, Ashfaq2 (AUTHOR), Dawal, Siti Zawiah Md3 (AUTHOR), Tayyab, Aisha4 (AUTHOR), Rashid, Zahid4 (AUTHOR)
Publikováno v:
BMC Musculoskeletal Disorders. 10/1/2024, Vol. 25 Issue 1, p1-9. 9p.
Autor:
Pereira, Olivier1,2 (AUTHOR) olivier.pereira@whut.edu.cn, Qin, Wei3 (AUTHOR), Galand, Pierre E.4 (AUTHOR), Debroas, Didier5 (AUTHOR), Lami, Raphael6 (AUTHOR), Hochart, Corentin4 (AUTHOR), Zhou, Yangkai1 (AUTHOR), Zhou, Jin7 (AUTHOR), Zhang, Chuanlun1,8 (AUTHOR) zhangcl@sustech.edu.cn
Publikováno v:
mLife. Sep2024, Vol. 3 Issue 3, p417-429. 13p.
Autor:
Wild, Nele1,2 (AUTHOR) c_kais08@uni-muenster.de, Kaiser, Charlotte Sophia2 (AUTHOR) liebaue@uni-muenster.de, Wunderlich, Gerhard1 (AUTHOR) gwunder@usp.br, Liebau, Eva2 (AUTHOR), Wrenger, Carsten1,3 (AUTHOR) gwunder@usp.br
Publikováno v:
Receptors. Sep2024, Vol. 3 Issue 3, p408-424. 17p.
Autor:
Dean Cvetko, Luca Floreano, Herbert Over, S. Zennaro, Roberto Gotter, A. Morgante, S. Schwegmann, M. Peloi, V. De Renzi, F. Tommasini
Publikováno v:
ResearcherID
Physical Review B
Physical Review B
The temperature-dependent behavior of the Rh(111)-(2\ifmmode\times\else\texttimes\fi{}2)-1O phase was investigated by He-atom scattering (HAS) and low-energy electron diffraction. The adsorption system undergoes an order-disorder phase transition at
Autor:
Pietro Zanuttigh, Emanuele Menegatti, S. Zennaro, Matteo Munaro, Simone Milani, Stefano Ghidoni, Andrea Bernardi
Publikováno v:
ICME
Microsoft Kinect had a key role in the development of consumer depth sensors being the device that brought depth acquisition to the mass market. Despite the success of this sensor, with the introduction of the second generation, Microsoft has complet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f4ebb1bde4ad0b4cf7a78108ce030d4b
http://hdl.handle.net/11577/3168757
http://hdl.handle.net/11577/3168757
Autor:
Gerd Schönhense, M. Klais, N. Zema, S. Zennaro, Claus M. Schneider, Sergej A. Nepijko, Zbigniew Celinski, N.N. Sedov, N. Cramer
Publikováno v:
Applied physics. A, Materials science & processing
76 (2003): 809–816. doi:10.1007/s00339-002-1827-4
info:cnr-pdr/source/autori:Nepijko S.A., Klais M., Schonhense G., Cramer N., Celinski Z., Schneider C.M., Zennaro S., Zema N., Sedov N.N./titolo:Micromagnetism of two-dimensional permalloy particles with different aspect ratios/doi:10.1007%2Fs00339-002-1827-4/rivista:Applied physics. A, Materials science & processing (Print)/anno:2003/pagina_da:809/pagina_a:816/intervallo_pagine:809–816/volume:76
76 (2003): 809–816. doi:10.1007/s00339-002-1827-4
info:cnr-pdr/source/autori:Nepijko S.A., Klais M., Schonhense G., Cramer N., Celinski Z., Schneider C.M., Zennaro S., Zema N., Sedov N.N./titolo:Micromagnetism of two-dimensional permalloy particles with different aspect ratios/doi:10.1007%2Fs00339-002-1827-4/rivista:Applied physics. A, Materials science & processing (Print)/anno:2003/pagina_da:809/pagina_a:816/intervallo_pagine:809–816/volume:76
Micromagnetic properties of the Fe19Ni81 (5 nm)/NiO (50 nm)/Fe19Ni81 (30 nm) structured system have been investigated in a photoemission electron microscope in the magnetic X-ray circular dichroism operating mode. The microstructured Fe19Ni81 (5 nm)
Autor:
Gerd Schönhense, Ch. Ziethen, U Muschiol, N. Zema, M. Klais, Andreas Oelsner, Oliver G. Schmidt, C.M. Schneider, Zbigniew Celinski, N. Cramer, D Tietjen, O. de Haas, S. Zennaro
Publikováno v:
Journal of physics. D, Applied physics
35 (2002): 2472–2478. doi:10.1088/0022-3727/35/20/302
info:cnr-pdr/source/autori:Schneider C.M., De Haas O., Tietjen D., Muschiol U., Cramer N., Celinski Z., Oelsner A., Klais M., Ziethen Ch., Schmidt O., Schvnhense G., Zema N., Zennaro S./titolo:Size dependence of magnetic domain patterns in exchange-biased Permalloy%2FNiO microstructures/doi:10.1088%2F0022-3727%2F35%2F20%2F302/rivista:Journal of physics. D, Applied physics (Print)/anno:2002/pagina_da:2472/pagina_a:2478/intervallo_pagine:2472–2478/volume:35
35 (2002): 2472–2478. doi:10.1088/0022-3727/35/20/302
info:cnr-pdr/source/autori:Schneider C.M., De Haas O., Tietjen D., Muschiol U., Cramer N., Celinski Z., Oelsner A., Klais M., Ziethen Ch., Schmidt O., Schvnhense G., Zema N., Zennaro S./titolo:Size dependence of magnetic domain patterns in exchange-biased Permalloy%2FNiO microstructures/doi:10.1088%2F0022-3727%2F35%2F20%2F302/rivista:Journal of physics. D, Applied physics (Print)/anno:2002/pagina_da:2472/pagina_a:2478/intervallo_pagine:2472–2478/volume:35
The magnetic domain structure in Permalloy (Ni81Fe19) micropatterns (10?100??m) on NiO has been investigated by means of soft x-ray photoemission electron microscopy. The exchange anisotropy between the Ni81Fe19 patterns and the NiO layer results in
Autor:
Claus M. Schneider, N.N. Sedov, Gerd Schönhense, U. Muschiol, S. Zennaro, Sergej A. Nepijko, N. Zema
Publikováno v:
Annalen der Physik (Weinheim. Internet) 11 (2002): 461–472. doi:10.1002/1521-3889(200206)11:6<461::AID-ANDP461>3.0.CO;2-6
info:cnr-pdr/source/autori:Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N./titolo:Resolution of an emission electron microscope in the presence of magnetic fields on the object/doi:10.1002%2F1521-3889(200206)11:6<461::AID-ANDP461>3.0.CO;2-6/rivista:Annalen der Physik (Weinheim. Internet)/anno:2002/pagina_da:461/pagina_a:472/intervallo_pagine:461–472/volume:11
info:cnr-pdr/source/autori:Nepijko S. A., Sedov N. N., Schonhense G., Muschiol U., Schneider C. M., Zennaro S., Zema N./titolo:Resolution of an emission electron microscope in the presence of magnetic fields on the object/doi:10.1002%2F1521-3889(200206)11:6<461::AID-ANDP461>3.0.CO;2-6/rivista:Annalen der Physik (Weinheim. Internet)/anno:2002/pagina_da:461/pagina_a:472/intervallo_pagine:461–472/volume:11
The known Brüche-Recknagel formula for determining the resolving power of an emission electron microscope (EEM) was derived assuming idealized conditions: the object surface was planar, and the accelerating electric field was homogeneous. However, d
Autor:
Andreas Oelsner, S. Zennaro, N.N. Sedov, Gerd Schönhense, Gerhard H. Fecher, M. Klais, N. Zema, Oliver G. Schmidt, U. Muschiol, Sergej A. Nepijko, Claus M. Schneider
Publikováno v:
Applied Physics A: Materials Science & Processing. 74:295-298
It is shown that magnetic X-ray circular dichroism (MXCD) can be exploited in photoemission electron microscopy not only to visualize the domain structure of ferromagnets, but also to perform quantitative measurements of the stray magnetic fields at
Autor:
R. Pontin, S. Turchini, L. Štichauer, Z. Šimša, Nicola Zema, A. Mirone, S. Zennaro, Corine Bonningue, F. Lama, T. Prosperi, Ph. Tailhades
Publikováno v:
Journal of Applied Physics. 90:2511-2516
The nanocrystalline MnxFe3−xO4 (x=0, 1.18, 1.56, and 1.9) spinel ferrite thin films were investigated by means of the x-ray absorption spectroscopy and x-ray magnetic circular dichroism at the Mn and Fe L2,3 edges. The cationic distributions of thi