Zobrazeno 1 - 7
of 7
pro vyhledávání: '"S. Yu. Zolotarevskii"'
Autor:
D. A. Novikov, G. N. Vishnyakov, S. A. Kononogov, S. Yu. Zolotarevskii, V. L. Lyaskovskii, G. G. Levin, A. S. Gusev
Publikováno v:
Measurement Techniques. 56:1006-1010
Results of an analysis of the procedural and instrumental errors that unavoidably arise in measurement of the texture and shape parameters of a surface by means of the methods of three-dimensional interferometry with reference wave front and lateral
Autor:
A. S. Gusev, V. L. Lyaskovskii, S. S. Golubev, S. A. Kononogov, S. Yu. Zolotarevskii, V. G. Lysenko, G. G. Levin
Publikováno v:
Measurement Techniques. 56:999-1005
The mechanism of formation of the uncertainty budget of measurements of the parameters of the texture and form of a surface in the nanometric range with reference to the typical optical circuits of the Twyman–Green and Fizeau interferometers is con
Publikováno v:
Measurement Techniques. 56:240-246
Review materials and international procedural regulatory documentation devoted to methods of areal (zone) characterization of the topography and texture of a rough surface are analyzed. Questions related to the use of special filters designed to elim
Publikováno v:
Measurement Techniques. 56:247-251
The great potential and utility of fractal methods in discrimination of the measured profiles of different surfaces and in the construction of functional models of interactions with surfaces are noted. An areal-scale analysis is performed in a study
Publikováno v:
Measurement Techniques. 53:878-881
Cross measurements of surface relief of nanometer dimensions using atomic-force microscopy and optical interferometry methods are described. The investigations enable the regions where it is best to use these methods for different kinds of objects to
Publikováno v:
Measurement Techniques. 53:251-256
Numerical simulation of the profile restoration procedure for an optical surface with scattering of radiation by nanostructures of the type of single grooves or single protrusions as well as that of a periodic “comb-like” profile is performed. A
Publikováno v:
Measurement Techniques.
Questions related to metrological assurance of measurements of the roughness and relief parameters of nanostructured surfaces are considered. On the basis of an analysis of current developments in the area of scanning probe microscopy, a description