Zobrazeno 1 - 3
of 3
pro vyhledávání: '"S. Yu. Tver'yanovich"'
Publikováno v:
Physics of the Solid State. 52:1957-1961
The factors responsible for the poor agreement between the experimental data on the depth of the generation of the Si L2,3 X-ray emission band excited by an electron impact in SiO2 layers and the results of the calculations performed in terms of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33c2475c9bec2cccea8c7296ea8b75d5
https://doi.org/10.1134/s1063783410090295
https://doi.org/10.1134/s1063783410090295
Autor:
Dmitry Marchenko, A. S. Shulakov, Andrey Sokolov, A. A. Ovchinnikov, S. Yu. Tver’yanovich, E. P Savinov, Valeri Afanas'ev, Elena O. Filatova
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 181:206-210
Analysis of interfaces between (1 0 0)Si crystal and 5-nm thin HfO 2 overlayers was conducted and the results obtained by a X-ray photoelectron spectroscopy (XPS) in combination with Ar + ion sputtering were compared to the results obtained by a non-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd2147843da053e568b50dac57a40195
https://doi.org/10.1016/j.elspec.2010.04.005
https://doi.org/10.1016/j.elspec.2010.04.005
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 72:434-438
The history of the development of ultrasoft X-ray emission depth-resolved spectroscopy is briefly reviewed. The results of the investigation of new model nanostructured materials (metal aluminum layers synthesized by atomic layer deposition on the su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c360e6e2ae88a634b8754d28f6e280e
https://doi.org/10.3103/s1062873808040047
https://doi.org/10.3103/s1062873808040047