Zobrazeno 1 - 4
of 4
pro vyhledávání: '"S. Yu. Tver'yanovich"'
Publikováno v:
Physics of the Solid State. 52:1957-1961
The factors responsible for the poor agreement between the experimental data on the depth of the generation of the Si L2,3 X-ray emission band excited by an electron impact in SiO2 layers and the results of the calculations performed in terms of the
Autor:
Dmitry Marchenko, A. S. Shulakov, Andrey Sokolov, A. A. Ovchinnikov, S. Yu. Tver’yanovich, E. P Savinov, Valeri Afanas'ev, Elena O. Filatova
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 181:206-210
Analysis of interfaces between (1 0 0)Si crystal and 5-nm thin HfO 2 overlayers was conducted and the results obtained by a X-ray photoelectron spectroscopy (XPS) in combination with Ar + ion sputtering were compared to the results obtained by a non-
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 72:434-438
The history of the development of ultrasoft X-ray emission depth-resolved spectroscopy is briefly reviewed. The results of the investigation of new model nanostructured materials (metal aluminum layers synthesized by atomic layer deposition on the su
Autor:
Ovcharenko, R.1 r.e.ovcharenko@gmail.com, Tupitsyn, I.1 tup@pcqnt1.phys.spbu.ru, Savinov, E.1, Voloshina, E.2, Dedkov, Yu.3, Shulakov, A.1 shulak@paloma.spbu.ru
Publikováno v:
Journal of Experimental & Theoretical Physics. Jan2014, Vol. 118 Issue 1, p11-17. 7p.