Zobrazeno 1 - 7
of 7
pro vyhledávání: '"S. W. Janson"'
Autor:
S. W. Janson
Publikováno v:
Smaller Satellites: Bigger Business? ISBN: 9789048159062
Microelectronics uses batch-fabrication techniques to produce planar, interconnected sub-micron structures. Complimentary metal oxide semiconductor (CMOS) nanoelectronics will be mass-produced by the year 2004 when lateral structures smaller than 100
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41f7471a5785e09f259705dc7a2d0ac0
https://doi.org/10.1007/978-94-017-3008-2_2
https://doi.org/10.1007/978-94-017-3008-2_2
Publikováno v:
29th Joint Propulsion Conference and Exhibit.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::547f41c205d7ba152ae93f942203b4df
https://doi.org/10.2514/6.1993-2221
https://doi.org/10.2514/6.1993-2221
Autor:
S. W. Janson
Publikováno v:
29th Joint Propulsion Conference and Exhibit.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e74671afa2c4927a2ec754b2c8f18c20
https://doi.org/10.2514/6.1993-2220
https://doi.org/10.2514/6.1993-2220
Autor:
S. W. Janson
Publikováno v:
28th Joint Propulsion Conference and Exhibit.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae8f0e1a992fead7d99189ef695a109d
https://doi.org/10.2514/6.1992-3242
https://doi.org/10.2514/6.1992-3242
Publikováno v:
Review of Scientific Instruments. 60:3171-3180
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdb94655108101e00ce67145370e15ad
https://doi.org/10.1063/1.1140548
https://doi.org/10.1063/1.1140548
Publikováno v:
Physica Scripta. :47-51
An electron beam ion source to be used in atomic physics experiments has been designed, constructed and partially tested. The source utilizes a conventional solenoid and an externally launched electron beam. Ultra-high vacuum in the ionization region
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e0f2d4c5ad2ba13e91c57a0590ed091
https://doi.org/10.1088/0031-8949/1983/t3/011
https://doi.org/10.1088/0031-8949/1983/t3/011
Publikováno v:
IEEE Transactions on Nuclear Science. 28:2660-2662
An electron beam ion source (EBIS) for the production of low energy, multiply charged ion beams to be used in atomic physics experiments has been designed and constructed. An external high perveance electron gun is used to launch the electron beam in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::879de2d294ef45a00f33f7b13589baee
https://doi.org/10.1109/tns.1981.4331789
https://doi.org/10.1109/tns.1981.4331789