Zobrazeno 1 - 10
of 27
pro vyhledávání: '"S. V. Rykhlitskii"'
Autor:
M. V. Kruchinina, A. A. Gromov, L. V. Shcherbakova, E. V. Kruchinina, V. M. Generalov, K. V. Generalov, V. N. Kruchinin, S. V. Rykhlitskii, I. N. Yakovina, M. V. Yakovlev, O. V. Minin, I. V. Minin
Publikováno v:
Optics and Spectroscopy. 129:1327-1340
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f9a16fd038891c74b0d899268fd61a7
https://doi.org/10.1134/s0030400x21060060
https://doi.org/10.1134/s0030400x21060060
Publikováno v:
Optoelectronics, Instrumentation and Data Processing. 57:476-484
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6dbc01a73145f93baff388e8467a588
https://doi.org/10.3103/s8756699021050150
https://doi.org/10.3103/s8756699021050150
Autor:
V. N. Kruchinin, V. A. Volodin, S. V. Rykhlitskii, V. A. Gritsenko, I. P. Posvirin, Xiaoping Shi, M. R. Baklanov
Publikováno v:
Optics and Spectroscopy. 129:645-651
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::333837e69fa11e2e2ae7ef2207492233
https://doi.org/10.1134/s0030400x21050088
https://doi.org/10.1134/s0030400x21050088
Publikováno v:
Автометрия. 57:38-47
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ae581eae4ac9973f3539156fd3791c1
https://doi.org/10.15372/aut20210505
https://doi.org/10.15372/aut20210505
Autor:
A. P. Eliseev, S. V. Rykhlitskii, Timofey V. Perevalov, Vladimir N. Kruchinin, Vladimir A. Gritsenko, Elena E. Lomonova
Publikováno v:
Optics and Spectroscopy. 128:1963-1969
The luminescent and optical properties of materials based on zirconium(IV) oxide grown by crystallization of ZrO2 melts with 0, 2.0, 2.5, 2.8, and 3.7 mol % of Y2O3 are studied. Using Raman spectroscopy, it is found that this material with the Y2O3 c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3cf18a11dd73d0ca2e505b9d72b3609f
https://doi.org/10.1134/s0030400x20120991
https://doi.org/10.1134/s0030400x20120991
Publikováno v:
Optics and Spectroscopy. 128:1948-1953
A parametric model describing the spectra of optical constants n(λ) and k(λ) of a Hg1 – xCdxTe (MCT) solid solution for the x values in the range from 0.2 to 0.4 is developed. This model is based on empirical data measured in situ during the epit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99523bc35b4149261e3f02d9faed2f48
https://doi.org/10.1134/s0030400x20121042
https://doi.org/10.1134/s0030400x20121042
Autor:
S. V. Rykhlitskii, Gennadiy N. Kamaev, Vladimir A. Gritsenko, Vladimir N. Kruchinin, Timofey V. Perevalov
Publikováno v:
Optics and Spectroscopy. 127:836-840
The optical properties of amorphous nonstoichiometric silicon oxide (SiOx) films of variable composition (x = 0.62–1.92) formed by plasma-enhanced chemical vapor deposition are studied in the spectral range of 1.12–4.96 eV. Spectral ellipsometry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14408ceac9f5319b468b6382b22e94a0
https://doi.org/10.1134/s0030400x19110183
https://doi.org/10.1134/s0030400x19110183
Autor:
Vladimir N. Kruchinin, S. V. Rykhlitskii, S. V. Shekhovtsov, S. E. Pel’tek, Ya. I. Prudnikova, E. V. Spesivtsev, M. V. Kruchinina, Vladimir A. Volodin
Publikováno v:
Optics and Spectroscopy. 127:170-176
Diagnostic pilot monitoring of the groups of healthy patients and patients with colorectal cancer (CRC) at different stages of the disease was carried out using Raman spectroscopy (RS) and measuring the state of polarized light near the conditions of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b05888a4eaa6ad5a83943c5493004380
https://doi.org/10.1134/s0030400x19070142
https://doi.org/10.1134/s0030400x19070142
Publikováno v:
Optics and Spectroscopy. 125:1019-1024
The optical properties of thin films based on unsubstituted and tetrafluoro-substituted zinc phthalocyanines synthesized by physical vapor deposition are studied within the wavelength range of 250–1000 nm. Spectroscopic ellipsometry shows that film
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0179a371f0d53444e70b6be6e7234b60
https://doi.org/10.1134/s0030400x18120093
https://doi.org/10.1134/s0030400x18120093
Publikováno v:
Infrared Physics & Technology. 116:103793
Low temperature in situ control in the technology of HgCdTe layers growing by MBE is a key requirement for obtaining structures of high quality. Spectroscopic ellipsometry seems to be one of the suitable technique for solving this problem. The presen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bf540cf25b0a6efd9c8dbb5de838c39
https://doi.org/10.1016/j.infrared.2021.103793
https://doi.org/10.1016/j.infrared.2021.103793