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pro vyhledávání: '"S. V. Kondratjev"'
Autor:
I. G. Bronshtein, A. S. Korenev, F. M. Inochkin, Sergey K. Kruglov, T. A. Kompan, N. F. Pukhov, S. V. Kondratjev
Publikováno v:
Optical Measurement Systems for Industrial Inspection X.
A new method for precise subpixel edge estimation is presented. The principle of the method is the iterative image approximation in 2D with subpixel accuracy until the appropriate simulated is found, matching the simulated and acquired images. A nume