Zobrazeno 1 - 10
of 31
pro vyhledávání: '"S. Sitarek"'
Publikováno v:
Fibres and Textiles in Eastern Europe. 24:95-102
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efe4b500c2dc35b626d6581c65789922
https://doi.org/10.5604/12303666.1196618
https://doi.org/10.5604/12303666.1196618
Autor:
Marek Wychowaniec, Krzysztof Kopczynski, Tomasz Kozlowski, Jarosław Kisielewski, Ryszard Stepien, S. Sitarek, Dariusz Litwin, Marek Daszkiewicz, Kamil Radziak, Adam Czyzewski, Jacek Galas, Jarosław Młyńczak
Publikováno v:
SPIE Proceedings.
The phenomenon of laser light scattering provides the technology for visualization and testing the inner structure and homogeneity of materials. Some of them excited by the laser light in the tomographic process can emit light the wavelength of which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96753418b58834d0835d2024a495dd2f
https://doi.org/10.1117/12.2280320
https://doi.org/10.1117/12.2280320
Publikováno v:
SPIE Proceedings.
The paper presents a relatively simple though effective approach to fringe field processing for variable wavelengthinterferometry- related techniques including a detailed analysis of noise influence on the accuracy of fringe parameters extraction.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8f86472670290d99b4b43f59dc9b2b4
https://doi.org/10.1117/12.2280328
https://doi.org/10.1117/12.2280328
Publikováno v:
Atmospheric Research. 142:32-39
The properties of atmospheric aerosol under a cumulus base were studied using three-wavelength lidar. A growth of hygroscopic aerosol particles in a convective updraft and the activation of cloud condensation nuclei (CCN) were observed. A simple and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::177e706413fd14c227c88141b0f004c1
https://doi.org/10.1016/j.atmosres.2013.10.023
https://doi.org/10.1016/j.atmosres.2013.10.023
Autor:
Henryk A. Kowalski, Piotr Wikliński, S. Sitarek, Jacek Galas, Anna Tyburska-Staniewska, Dariusz Litwin, Marek Daszkiewicz, Andrzej Ramsza, Łukasz Dałek, Grzegorz Mazur, Janusz Rzeszut
Publikováno v:
SPIE Proceedings.
The paper concerns the development of an optical emission spectrometer with a helium microwave rotating plasma as the excitation source which is an alternative to ICP spectrometers. In the new solution helium is used as the plasma and carrier gases,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cd4486fad6afe409ec54f9d597ff6ede
https://doi.org/10.1117/12.2263230
https://doi.org/10.1117/12.2263230
Autor:
Jacek Galas, Adam Czyzewski, Dariusz Litwin, Maciej Kochanowski, Katarzyna Kolacz, Maciej Socjusz, S. Sitarek
Publikováno v:
Optical Memory and Neural Networks. 21:86-93
This paper presents the Variable Wavelength Interferometry (VAWI) technique, its applications and expected research potential of this system equipped with a femtosecond laser. The system is configured for observation and measurement of local optical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61ea5cbc07f7527507a037622e8be016
https://doi.org/10.3103/s1060992x12020014
https://doi.org/10.3103/s1060992x12020014
Publikováno v:
Proc. SPIE 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics
The paper is aimed at describing measurement methodology for characterizing quality of a silicon wafer applied as a focusing element in the Scanning Helium Microscope and continues the struggle against phenomena decreasing accuracy. The focusing mirr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::261e39dbb7105d9d51d20abea69042a1
https://doi.org/10.1117/12.822411
https://doi.org/10.1117/12.822411
Publikováno v:
SPIE Proceedings.
The Scanning Helium Microscopy is a new technique currently under development. The paper is an overview of measurements of the geometrical characteristics of Silicon wafer concentrating on accuracy and closely related matters. In the microscope the h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1d2625156fbfe8586b28ba440a9e470
https://doi.org/10.1117/12.784913
https://doi.org/10.1117/12.784913
Publikováno v:
SPIE Proceedings.
The paper provides new insights into Silicon wafer measurements in context of technological problems of developing a sophisticated measurement technique, which harnesses helium atom beam as a probe. Nano-resolution imaging techniques such as scanning
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a023d3b50cd5877c20fe6dd81941774
https://doi.org/10.1117/12.662234
https://doi.org/10.1117/12.662234
Publikováno v:
Nuclear Instruments and Methods in Physics Research B 253(2006), 236-240
EMRS Spring Meeting, 29.05.-03.06.2006, Nice, France
EMRS Spring Meeting, 29.05.-03.06.2006, Nice, France
The ultra-thin 2 in. diameter silicon (1 1 1)-H(1 × 1) wafer appeared to be a promising material for a mirror focusing He-atom beam in a scanning atom microscope. To increase achievable at present resolution from 1.5 μm to a sub-micron range the 50
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9501f81c445cd01881da5f04b9d934ae
https://www.hzdr.de/publications/Publ-8506-2
https://www.hzdr.de/publications/Publ-8506-2
