Zobrazeno 1 - 10
of 29
pro vyhledávání: '"S. Pullela"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 16:210-215
Sensitivity-based methods for wire sizing have been shown to be effective in reducing clock skew in routed nets. However, lack of efficient sensitivity computation techniques and excessive space and time requirements often limit their utility for lar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2507e341a29a40b30e56b3452bec2b7a
https://doi.org/10.1109/43.573836
https://doi.org/10.1109/43.573836
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 13:1526-1535
With finer line widths and faster switching speeds, the resistance of on-chip metal interconnect is having a dominant impact on the timing behavior of logic gates. Specifically, the gates are switching faster and the interconnect delays are getting l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4c84aeb61b8383a1ba605db22707a8f
https://doi.org/10.1109/43.331409
https://doi.org/10.1109/43.331409
Publikováno v:
IEEE/ACM International Conference on Computer-Aided Design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::deecea17fbfc6bb8e22c46745884b799
https://doi.org/10.1109/iccad.1994.629837
https://doi.org/10.1109/iccad.1994.629837
Publikováno v:
Proceedings of the IEEE Custom Integrated Circuits Conference.
An approach for accurately modeling the RC-interconnect delay and gate-loading effects in a hierarchical timing analyzer is presented. The change in gate-loading due to interconnect resistance is considered by an "effective capacitance" approximation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ff332cea13145588b67f8e4e18656b6
https://doi.org/10.1109/cicc.1992.591314
https://doi.org/10.1109/cicc.1992.591314
Publikováno v:
ITC
This work presents a simulation-based, fault insertion environment, which allows faults to be "injected" into a Verilog model of the hardware. A co-verification platform is used to allow real, system level software to be executed in the simulation en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da63994e6c40ff3079e4945eae31e43f
https://doi.org/10.1109/test.2004.1387332
https://doi.org/10.1109/test.2004.1387332
Publikováno v:
SRDS
We propose a design strategy that exploits the strengths of different formal approaches to establish a reliable path from a mechanically verified high-level description to a concrete gate-level realization. We demonstrate the use of this approach in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18a8bafbf253a59a5044ff424b9b11da
https://doi.org/10.1109/reldis.1994.336902
https://doi.org/10.1109/reldis.1994.336902
Publikováno v:
Proceedings Design, Automation and Test in Europe.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ebf3490b9c7ce0fe17cb0af517b3d10c
https://doi.org/10.1109/date.1998.656001
https://doi.org/10.1109/date.1998.656001
Publikováno v:
ICCD
This paper describes a tool called Focus that is currently being used for the timing verification and siting of domino CMOS circuits in a Power PC/sup TM/ microprocessor. Domino CMOS circuits introduce more complex timing and sizing requirements comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9f8532718ea35b178ad8c87683d4d0ad
https://doi.org/10.1109/iccd.1997.628861
https://doi.org/10.1109/iccd.1997.628861
Autor:
S. Pullela, George J. Flick, Stephen A. Smith, Charles W. Coale, Custy F. Fernandes, George S. Libey
Publikováno v:
Journal of food protection. 61(2)
The nature and number of indicator and pathogenic microbes in fish reared using recirculating and nonrecirculating water systems were compared. For each system, 20 samples of rainbow trout (Oncorhynchus mykiss), tilapia (Oreochromis spp.), hybrid str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1e5b95b0d2982e1c1044a02d815695b7
https://pubmed.ncbi.nlm.nih.gov/9708283
https://pubmed.ncbi.nlm.nih.gov/9708283
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