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pro vyhledávání: '"S. P. Baranowski"'
Autor:
L. J. Elliott, Spooner Terry A, Mike C. Broomfield, S. P. Baranowski, L. Brooke, James R. Lloyd, Larisa Kisselgof
Publikováno v:
SPIE Proceedings.
Attempts to improve the reliability of narrow passivated Al/Cu conductors as defined by the performance in an accelerated electromigration test are reviewed. The results are explained in terms of the effect of thermally induced stress and stress void
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc056eb230d6ea69ef7a111cc54342bf
https://doi.org/10.1117/12.145478
https://doi.org/10.1117/12.145478
