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pro vyhledávání: '"S. O. O. Edward"'
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LASCAS
We present DC and AC electrical characterization and temperature dependence of Ag/Porous Silicon/p-Si/Al structures to examine conduction mechanisms. Porous Silicon (PS) layers were manufactured by electrochemical etching in p-type wafer silicon. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e1330b58a1b619dd12b4fc5c039e9cd
https://doi.org/10.1109/lascas.2013.6519078
https://doi.org/10.1109/lascas.2013.6519078
