Zobrazeno 1 - 10
of 41
pro vyhledávání: '"S. M. Heald"'
Publikováno v:
AIP Advances, Vol 8, Iss 12, Pp 125219-125219-10 (2018)
We report a charge-transfer mechanism in tuning of magnetism of Nd-substituted Gd5-xNdxSi4 (x=1 and 2.5) compounds. The X-ray absorption near edge structure measurements demonstrated that Nd substitutions for Gd induce charge transfer of 5d electrons
Externí odkaz:
https://doaj.org/article/196f8986664349bb9480bca6c665cc88
Publikováno v:
Journal of Physics: Conference Series. 712:012123
The local structural and local density of states of vertically-aligned ZnO nanorods are examined by using polarization-dependent diffraction anomalous near edge structure (DANES) measurements from c-oriented ZnO nanorods at the Zn K edge at the geome
Autor:
S. M. Heald, B. Nielsen
Publikováno v:
Journal of Applied Physics. 72:4669-4673
X‐ray reflectivity has been used to determine the absolute metal density for both metals in bilayers of Al on top of Co, Cr, Cu, Mn, Ni, and Pd. A large variation in density is found with an observed range of 0.87–1.0 of bulk values. The results
Autor:
S. M. Heald, Zhengquan Tan
Publikováno v:
Journal of Applied Physics. 71:3766-3772
We have studied the interface structure and reactions of Ni–Cr alloy and Al thin film bilayers using glancing‐angle x‐ray reflectivity and extended x‐ray‐absorption fine structure techniques. The Al/Ni–Cr bilayers were prepared by evapora
Autor:
S. M. Heald
Publikováno v:
Review of Scientific Instruments. 63:873-878
Extended x‐ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al b
Autor:
S. M. Heald, G. M. Lamble
Publikováno v:
Review of Scientific Instruments. 63:880-884
The X‐11A beamline at the NSLS has been upgraded to include a dynamic sagittally focusing second crystal in the monochromator, currently operating in the range 5.5–11 keV. The monochromator maintains a constant focus at the sample by adjustment o
Autor:
E. V. Barrera, S. M. Heald
Publikováno v:
Journal of Materials Research. 6:935-942
Glancing angle x-ray reflectivity and EXAFS measurements have been made on a series of UHV prepared Al/Ni bilayers with varying amounts of oxygen impurities. These samples show an intrinsic reacted region prior to annealing, and for clean samples fur